Used ADVANTEST T 5377 #9210975 for sale
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ID: 9210975
Memory tester
(2) Test heads
Channels
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION
1. 512DR + 320 I/O (QUARTER)
2. 1024DR + 640 I/O (HALF)
3. 2408DR + 1280 I/O (FULL) [1-3] ...> 3
NUMBER OF TEST HEAD [1,2] ...........................> 2
TYPE OF DR PE [1:DR PE, 2:24Ch HVDR PE] .............> 1
CONFIGURATION OF TEST HEAD 1
PE BOARD TYPE 0.NOT EXIT
1. EXIT
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
IO PIN 33A1 97A 33A5 97A5
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
CONFIGURATION OF TEST HEAD 2
PE BOARD TYPE 0.NOT EXIT
1. EXIT
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
IO PIN 33A1 97A 33A5 97A5
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
CONFIGURATION OF DPU
TEST HEAD 1 DC CONFIGURATION [1-64] .............> 1-64
PPS CONFIGURATION [1-256] ............> 1-256
TEST HEAD 2 DC CONFIGURATION [1-64] .............> 1-64
PPS CONFIGURATION [1-256] ............> 1-256
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> NO
CONFIGURATION OF FM
NUMBER OF FMRA BOARD [0-16] ...........................> 16
SIZE OF FMRA BOARD [1:8G, 2:16G] ....................> 1
PM(PATTERN MEMORY) BOARD EXIST [Y,N] ..................> NO.
ADVANTEST T 5377 is a Final Test Equipment that is a fully-featured and cost-effective solution for test and measurement. It is designed to meet the needs of today's complex product design and development requirements, and provides a suite of comprehensive tools that are required for rapid system analysis and failure diagnostics. ADVANTEST T5377 is based on a highly advanced field programmable gate array (FPGA) technology and uses innovative design techniques that enable high test speed and low data overhead. Its high speed pulse test systems measure pulse signals in both directions, and are customizable to meet the application-specific requirements. The unit also features an integrated power supply that is capable of up to 2.5kW of output power. The machine also incorporates user-friendly, intuitive user interface, providing a fast, powerful, and easy to use and configure tool that meets the needs of both experienced and novice users. The integrated test asset contains a number of useful features that enable the development team to quickly and accurately identify and isolate potential problems while performing model analysis. Advanced features such as Circuit Trace, Signal Check, Error Capture, Clock Trace, and Auto Diagnosis help streamline the process of problem isolation. The acquisition equipment utilizes a wideband acquisition architecture, capable of capturing signals at high speed and low power consumption. Dynamic range of up to55dB is available to help address the demands of increasingly complex applications. Since T 5377 supports a variety of test parameters, it is well-suited for testing a wide range of products including mixed-signals, high-frequency communications, signal integrity, and digital circuit boards. The system also possesses single-pin isolation capabilities, allowing the user to accurately measure individual probe signals in isolation from the remaining test-bed environment. Overall, T5377 is a final test unit that has been specifically designed for the demanding requirements of product design and development. Its combination of powerful, yet intuitive features, high speed pulse test systems, and excellent data acquisition capabilities make it a cost effective solution for measuring the performance of unprecedented levels of complexity. With a wide range of application and product support, ADVANTEST T 5377 is an ideal choice for testing and verifying a range of products.
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