Used ADVANTEST T 5377S #293764490 for sale

ADVANTEST T 5377S is a highly reliable, efficient, and accurately performing final test system designed for multiple applications and defect testing. Its 24-stage architecture supports scalable testcell configurations, allowing automated test systems for any test requirement. It offers an advanced measurement capability, with data streaming to allow real-time processing for increased throughput. ADVANTEST T5377S uses its intuitive GUI (Graphical User Interface) to simplify the test process. The system supports data collection, allowing data to be easily stored in standard formats. Its versatile scan-chain architectures are created with up to 32 bits for data streaming. T 5377 S CPU operates with up to four 32 bit processors and up to 8 gigabytes of memory, providing adequate resources for automated testing. T 5377S provides high accuracy measurements due to its advanced calibration and measurement technologies with embedded sensors. Its advanced calibration options allow fast and easy calibration for both high-speed scanning and parallel testing operations. It is designed with advanced defect diagnosis and fault detection algorithms to identify individual defective chips quickly. T5377S includes a powerful array of Signal Conditioners (SCs), Clock Generators (CG's), and Probes, which are all synchronized to ADVANTEST T 5377 S controller. The system can measure various silicon test structures, including including transistor region testing, secondary parameter optimization, and full-die characterization. It also has a full identification routine for quickly identifying die information. ADVANTEST T 5377S also includes a real-time data analysis engine for fast data result calculation. It has high-throughput signal-conditioning technology to reduce testing time. Its self-diagnostic techniques detect any irregularities in signals and errors to ensure accurate results. It also contains a signal-trace capability to track signal-level performance and resolve test failures. ADVANTEST T5377S is highly reliable and offers a comprehensive and complete array of multi-application testing and defect analysis capabilities. It provides customers with excellent product life-tests and eliminates the need for manual test-cell configuration. Its advanced calibration and measurement technologies, multi-application testing support, embedded sensors, and real-time data analysis capabilities make it ideal for a variety of final test systems.