Used ADVANTEST T 5383 #9278359 for sale

ADVANTEST T 5383 Test Equipment is a final test system designed to provide test coverage and yield optimization for today's high-performance Integrated Circuits (ICs). It is equipped with high-speed signal integrity, long test times, and high throughput accuracy. It supports a variety of test applications such as Functional Testing, RF testing, Hall Effect testing, and Delay testing. The unit is composed of four main modules, including a test head, a controller, a power unit, and a test machine controller. The test head houses the test probe heads which are used to access the devices' IO pins during testing. It also contains high-speed Magnetic Measurement tools which measure specific electromagnetic characteristics of a device. The controller contains the high-end data acquisition modules which help to acquire comprehensive and accurate data about the device under test. The power unit is responsible for providing pulse power which is used to drive the devices during testing. Finally, the test tool controller acts as the bridge between the other modules to ensure that the testing process is integrated and systematic. ADVANTEST T5383 Test Asset offers modularity and flexibility, with options for extended testing capabilities, as well as measurement and monitoring capabilities. It is equipped with a powerful embedded processing architecture that can quickly capture signals while still providing high-speed signal integrity. Furthermore, its advanced Condition Based Analyzing Tool (CBA-Tool) allows users to optimize yield and reporting capabilities in a flexible way. Lastly, it offers a Dynamic and Adaptive Scanning (DAS) technique which further improves the test coverage and yield accuracy. It is capable of capturing signal conditions on-the-fly while providing a simple setup to enable higher scalability. The DAS feature also includes an advanced defect analysis model and identity recognition capability which can be used to analyze the device's features. In conclusion, T 5383 Test Equipment is an integral test solution for today's sophisticated ICs. With its robust test capabilities, reliability, and scalability, it will provide users with maximum yield optimization potential and comprehensive testing capabilities.