Used ADVANTEST T 5503 #9203266 for sale
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ID: 9203266
Memory tester
Head type: 8448 Channels
Mother board: 512 Para type
Frequency: 1.143 GHz / 2.286 Gbps
Workstation: WUN-H3610295EWS
CPU: Pentium(R) 4 CPU 2.80 GHz
Docked with M6242 handler
TH Channels:
DR: 3840DR + 768DR
IO: 3072IO
HSCLK Mode
Level DR: 768LVDR
PPS: 768 PPS + 256 PPS
DC: 128DC
FC Channels: 120DR+24DR / 96IO
Accuracy:
OTA: +/- 75ps (SBCAL)
Dr/Cp Skew: 60 ps p-p
Parallel test:
X8 / x9: 256 DUT / System
PIN No: 1-30, 33-56, 65-94, 97-120, 129-158, 161
TP: 101-199
PB: 101-199
DPU: 1-99, 101-199
ALPG: 1-99, 101-199
FT: 1-99, 101-199
TH: 1-99, 101-199
Board configuration:
Slot / Type / Rev
PE1A1 / PE board / BCC
PE7A1 / PE board / BCC
PE13A1 / PE board / BCC
PE65A1 / PE board / BCC
PE71A1 / PE board / BCC
PE77A1 / PE board / BCC
PE1C1 / PE board / BCC
PE7C1 / PE board / BCC
PE13C1 / PE board / BCC
PE65C1 / PE board / BCC
PE71C1 / PE board / BCC
PE77C1 / PE board / BCC
OPPEA1 / - / ABC
OPPEC1 / - / ABC
DCPPS1 / - / CFA
DCPPS2 / - / CFA
DCPPS3 / - / CFA
DCPPS4 / - / CFA
OPPPS / - / CFA
THDIST / - / BAC
PLL / - / AHA
SYSMONI / - / ADA
2 (TPU) / TBUS IF Board / AHA
2012 vintage.
ADVANTEST T 5503 is a reliable and accurate final test equipment designed for dedicated testing of semiconductor wafer dies. It manages automated, high resolution testing of semiconductor devices for a variety of applications. The device is also a cost effective solution with a compact footprint. T 5503 is equipped with an 8-bit, 130 nanosecond resolution, 32-bit data acquisition system, capable of throughputs of up to 1,000 samples per second. It is also compatible with almost all available test heads, allowing for tailored device tests. In addition, it features an integrated Automatic Test Programming (ATP) unit that allows for convenient setup and integration of tests. The device's measurement capabilities include voltage, current, resistance, power, capacitance, and other parameters. Equipped with a comprehensive set of control and measurement functions, ADVANTEST T 5503 can manage a variety of test routines simultaneously. It can control numerous parameters, including supply voltage, stimulation signal, measurement frequency, and sampling settings. T 5503 utilizes built-in signal conditioning and analysis equipment that interpret and store test results. Data can be categorized for easy retrieval and trend analysis. The device is also connected to a probe station capable of scanning and compressing data before sending it to the machine's memory. The tool is currently available in two packages: standard and high-performance configurations. Both configurations include a 10-inch TFT LCD screen for graphics and data display. Also, the standard package is equipped with a LAN port and optional software for secure data collection and systems management. The asset is enclosed in an easy-to-use housing and is supported by a comprehensive service and warranty program. ADVANTEST T 5503 is a quality, cost efficient solution for testing semiconductor devices with superior reliability and excellent levels of quality assurance.
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