Used ADVANTEST T 5503 #9203266 for sale

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Manufacturer
ADVANTEST
Model
T 5503
ID: 9203266
Memory tester Head type: 8448 Channels Mother board: 512 Para type Frequency: 1.143 GHz / 2.286 Gbps Workstation: WUN-H3610295EWS CPU: Pentium(R) 4 CPU 2.80 GHz Docked with M6242 handler TH Channels: DR: 3840DR + 768DR IO: 3072IO HSCLK Mode Level DR: 768LVDR PPS: 768 PPS + 256 PPS DC: 128DC FC Channels: 120DR+24DR / 96IO Accuracy: OTA: +/- 75ps (SBCAL) Dr/Cp Skew: 60 ps p-p Parallel test: X8 / x9: 256 DUT / System PIN No: 1-30, 33-56, 65-94, 97-120, 129-158, 161 TP: 101-199 PB: 101-199 DPU: 1-99, 101-199 ALPG: 1-99, 101-199 FT: 1-99, 101-199 TH: 1-99, 101-199 Board configuration: Slot / Type / Rev PE1A1 / PE board / BCC PE7A1 / PE board / BCC PE13A1 / PE board / BCC PE65A1 / PE board / BCC PE71A1 / PE board / BCC PE77A1 / PE board / BCC PE1C1 / PE board / BCC PE7C1 / PE board / BCC PE13C1 / PE board / BCC PE65C1 / PE board / BCC PE71C1 / PE board / BCC PE77C1 / PE board / BCC OPPEA1 / - / ABC OPPEC1 / - / ABC DCPPS1 / - / CFA DCPPS2 / - / CFA DCPPS3 / - / CFA DCPPS4 / - / CFA OPPPS / - / CFA THDIST / - / BAC PLL / - / AHA SYSMONI / - / ADA 2 (TPU) / TBUS IF Board / AHA 2012 vintage.
ADVANTEST T 5503 is a reliable and accurate final test equipment designed for dedicated testing of semiconductor wafer dies. It manages automated, high resolution testing of semiconductor devices for a variety of applications. The device is also a cost effective solution with a compact footprint. T 5503 is equipped with an 8-bit, 130 nanosecond resolution, 32-bit data acquisition system, capable of throughputs of up to 1,000 samples per second. It is also compatible with almost all available test heads, allowing for tailored device tests. In addition, it features an integrated Automatic Test Programming (ATP) unit that allows for convenient setup and integration of tests. The device's measurement capabilities include voltage, current, resistance, power, capacitance, and other parameters. Equipped with a comprehensive set of control and measurement functions, ADVANTEST T 5503 can manage a variety of test routines simultaneously. It can control numerous parameters, including supply voltage, stimulation signal, measurement frequency, and sampling settings. T 5503 utilizes built-in signal conditioning and analysis equipment that interpret and store test results. Data can be categorized for easy retrieval and trend analysis. The device is also connected to a probe station capable of scanning and compressing data before sending it to the machine's memory. The tool is currently available in two packages: standard and high-performance configurations. Both configurations include a 10-inch TFT LCD screen for graphics and data display. Also, the standard package is equipped with a LAN port and optional software for secure data collection and systems management. The asset is enclosed in an easy-to-use housing and is supported by a comprehensive service and warranty program. ADVANTEST T 5503 is a quality, cost efficient solution for testing semiconductor devices with superior reliability and excellent levels of quality assurance.
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