Used ADVANTEST T 5581 / M 6741A #186026 for sale

ADVANTEST T 5581 / M 6741A
ID: 186026
Test Cell (1) T 5581 Tester and (2) M 6741A handlers.
ADVANTEST T 5581 / M 6741A Final Test Equipment is a cutting-edge test system designed to meet the needs of the latest electronics test requirements. It is capable of performing mass production test of a wide variety of active and passive device types at high speed, with accurate results. T 5581 / M 6741A can accurately measure and characterize a wide range of parameters including I-V bias curves, waveforms, pulse waveforms, and impedance profiles. This unit also provides advanced analysis of parameters with high basic accuracy such as rise/fall times, frequency, phase, and power. The machine is composed of two main components - the T 5581 Test Handler and the M 6741A Test Tool. The T 5581 Test Handler supports automatic loading, unloading, sorting, and transferring of device types. The asset has a high-speed single-sided horizontal transport, four pickup positions with quick change capability, and a multi-divider travel mechanism. This model offers production rates of up to 4800 UPH (units per hour) and is designed to accommodate various device sizes and weights. The M 6741A Test Equipment contains a powerful CPU, high-performance memory and I/O, and a comprehensive library of test programs for the testing of the device. It allows for the execution of series testing, single device measurements and characterization, and comparison tests. It is equipped with six multiplexing drivers and a high-power amplifier that provides an output power up to 2500W. The M 6741A also supports sequential, parallel, and special test sequences for high-speed testing with quick response time. ADVANTEST T 5581 / M 6741A Final Test System provides a comprehensive and reliable testing solution for a wide range of device types. It is designed for high-speed mass production testing, characterized by its easy operation, high-speed performance, and reliable, accurate results. This unit offers excellent performance and is ideal for the testing of integrated circuits, high-speed devices, and other semiconductor devices.
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