Used ADVANTEST T 5581 P #161369 for sale

Name: ADVANTEST T 5581 P
Brand: ADVANTEST
SKU: 161369
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Manufacturer

ADVANTEST

Model

T 5581 P

ID: 161369

Memory test system SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.320DR+144I/O 2.480DR+144I/O 3.320DR+288I/O 4.480DR+288I/O [1-4] ............> 1 TH CABLE LENGTH 1.5M 2.8M [1,2] ......................> 2 NUMBER OF TEST HEAD [1,2] ...........................> 1 CONFIGURATION OF TEST HEAD 1 TEST HEAD TYPE 1.800CH 2.1600CH [1,2] .....................> 1 PE BOARD TYPE 0.NO BOARD 1.BGM-021633 (FULL PE) 2.BGM-021633X02 (I/O PE) 3.BGM-021633X03 (DR PE) SLOT 33 36 39 161 164 167 CHILD A ....> 1 1 1 3 0 0 CHILD B ....> 1 1 1 3 0 0 CHILD C ....> 0 0 0 0 0 0 CHILD D ....> 0 0 0 0 0 0 CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-16] .............> 1-16 10V PPS CONFIGURATION [1-48,97-128] ......> 1-16 AC FREQUENCY (Hz) [50,60] ........................> 50 CONFIGURATION OF ALPG NUMBER OF ALPG [1,2,4] ..............................> 2 CONFIGURATION OF DBM DBM OPTION EXIST [Y,N] ..............................> YES SIZE OF DBM BOARD ....................................> 64KW*240B CONFIGURATION OF FM TYPE OF FM [1-2] [1:NORMAL(AFM) 2:MRA4(FMRA)] .......> 1 NUMBER OF FM BOARD [0-8] ............................> 4 SIZE OF AFM BOARD [0-2] [0:256K 1:1M 2:4M] ........> 1 PATTERN MEMORY(PM) BOARD EXIST [Y,N] ................> NO CONFIGURATION OF MRA MRA3 OPTION [Y,N] ...........................> YES MRA OPTION TYPE [ 3] (3: MRA3) ................ > 3 TYPE OF CBU BOARD [1,2] (1: BGR-019267 ) (2: BGR-019267X02) ....> 1 NUMBER OF CBU BOARD [1-8] ...........................> 4 TYPE OF FBM BOARD [1,2,3] (1: 4M*72BIT) (2: 8M*72BIT) (3:16M*72BIT) .........> 1 NUMBER OF FBM BOARD [1-4] ...........................> 4 RESULT DATA HI-SPEED READ FUNCTION [Y,N] .............> YES COMPRESSION FUNCTION [Y,N] ...........................> NO CONFIGURATION OF FCDC PIN PATTERN OPTION [Y,N] ...........................> YES PIN DRE OPTION [Y,N] ...........................> YES PIN CPE OPTION [Y,N] ...........................> YES END SAVE.

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ADVANTEST T 5581 P is an automated functional test equipment specifically designed for the testing of digital and mixed-signal products such as automotive electronics, consumer electronics, semiconductor devices, and other integrated circuit components. This system provides both high performance and reliable test coverage for a variety of devices. ADVANTEST T5581P integrates a 12-channel parallel multi-purpose I/O with clock speeds up to 50 MHz and a maximum of 4 analog or digital input/output cards. This allows for simultaneous testing of up to 24 channels. The unit also features a dual-core processor to provide a faster testing cycle of up to 400 kHz clock frequencies and over 150 m cycles per second. The built-in 2D scanner enables improved efficiency in testing and rapid cycle times, while the patented multi-sensor test signals eliminate false fail reports. Additionally, its easy-to-use external programming interface supports various programming languages, including Visual Basic, C++, ToolC, etc. The machine is combined with a powerful test development environment that provides flexibility to design complex test scenarios and easily customize test coverage according to customer specifications. Its Windows based GUI enables the user to quickly make changes and adjustments to their tests, including I/O channels, instruments, software, analog and digital signal definitions. In addition to the user-friendly interface, T 5581P also features an auto-generating approach which automatically generates benchmarking test programs that are in line with customer requirements. T5581P is a reliable and efficient automated testing solution that helps manufacturers meet the stringent quality requirements of their products. It is equipped with a range of safety features that ensure safe and error-free operations when running the tests, and can be used for both functional and boundary testing. The tool is also capable of verifying the functionality of multiple devices in one setup, making it suitable for large-scale and complex tests. Furthermore, its flexible architecture allows for the integration of multiple test suites and related equipment into one asset for further efficiency and cost saving.