Used ADVANTEST T 5581 P #293636059 for sale

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Manufacturer
ADVANTEST
Model
T 5581 P
ID: 293636059
Memory test system (2) Test head (Stations) 960 DR Channels 578 IO Channels TG Unit: Description / Part number BGR-022117 / CBOX I/F BIR-021588 / TG CORE BIR-021587 / TG SUB BIR-021718 / TG DIST 1 BIR-021718 / TG DIST 2 BGR-015554 / TG I/F WBL-0175758MB / TP4 CPU/MEM BGR-021321 / TP4A CH IF ALPG/FM Unit: Description / Part number / Qty Qty / Part number / Description (8) / BIR-021768 / AFM (1) / BIR-021764 / PG Control (2) / BIR-021765 / ALPG (2) / BGR-021766 / DBM (1) / BGR-022707 / FM CONT (1) / BIR-021769 / BGR-021770 / PM / FM TERM TGFC Unit: Qty / Part number / Description (1) / BGR-021938 / TGFC I/F (18) / BGR-021939 / TGFC (2) / BGR-021800 / PDS SC/VIO Unit: Qty / Part number / Description (1) / BGR-021618 / VIO I/F (2) / BGR-021619 / VIO CONT (2) / BGR-021615 / STRB GEN (8) / BGR-022681 / SC (1) / BGR-021617 / PCPE (1) / BGR-021616 / SCDIST (1) / BGR-021941 / FTDIST (1) / BGR-021940 / PPAT (1) / BGR-021613 / SC I/F DPU Unit: Qty / Part number / Description (2) / BGR-016793 / DPU I/F LOGI (2) / BGR-016794 / DPU I/F ANA (8) / BGR-016797 / DC CONT (8) / BGR-019486 / DC (2) / BGR-021964 / 10 V PPS CONT (8) / BGR-021926 / BGR-016796 / 10 V PPS TH Unit: Qty / Part number / Description (2) / BGM-021555 / TH CONT (4) / BGM-021558 / DC MUX (2) / BGM-021556 / CLAMP (8) / BGM-021557 / CAL and SIG (96) / BGM-021633 / PE.
ADVANTEST T 5581 P is a high-performance final test equipment designed for testing and verifying devices and systems. This system is able to rapidly detect defects in devices under test (DUTs), allowing for improved yield, increased throughput, and reduced costs while maintaining a high level of accuracy. ADVANTEST T5581P uses a unique combination of automated test execution, test data analysis, and real-time defect detection to quickly verify DUTs. Its high-speed parallel test buses are capable of processing a large number of data points related to the DUT performance in real time, reducing the time required for a comprehensive test. In addition, the unit utilizes sophisticated test-parameter-optimization software to maximize the accuracy and speed of each test. This helps minimize the time required to make a test-decision, resulting in higher throughput. The machine is able to control external instruments and obtain data from them during testing. This data can then be used in test-parameter-optimization, allowing the tool to adjust the test parameters according to device-under-test parameters to maximize accuracy and gain additional information which could improve overall test yield. It also features a versatile boundary-scan architecture which allows T 5581P to interface with external boundary-scan devices, providing an efficient way to test device boundaries. The asset is capable of testing digital-logic devices such as microprocessors, memory devices, memory devices, and analog-ICs. In addition, the model supports a wide range of flow-chart and algorithmic-level tests, including protocol-level testing and self-diagnostic tests. T5581P is designed for manual as well as automated testing and offers an integrated user interface for efficient test programming. This UI supports automatic routing rules and intelligent test-parameter adjustment strategies. T 5581 P has a wide operating temperature range, from -40°F to 70°F (-40°C to +21°C). It also features a selection of SmartPower features, allowing it to automatically adjust the power levels depending on the type of device being tested. ADVANTEST T 5581P is a reliable, high-performance and cost-effective final test equipment, boasting a wide range of features and capabilities that makes it an ideal choice for any test lab. It's easy-to-use user interface, test-parameter optimization, and combination of automated and manual testing capabilities make it an ideal solution for comprehensive device and system testing.
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