Used ADVANTEST T 5581 #100291 for sale

ADVANTEST T 5581 is an ultra high-speed, fully automated final test equipment that enables continuous, high-speed testing and allows comprehensive, accurate evaluation of test results. It is designed to path test various types of semiconductor devices in a highly efficient manner. The system has an advanced software architecture which enables its users to configure the unit to meet their testing needs. The software is highly customized for device testing and allows for customization of the testing process to achieve higher levels of accuracy, faster testing cycles and higher throughput. The machine provides a broad range of device test algorithms and its powerful programmable hardware architecture enables the hardware to adapt to the changing needs of the device testing process. ADVANTEST T5581 can test both analog and digital semiconductor devices from a single platform. It is equipped with a high-precision power supply and a wide range of test instrumentation, including frequency counter, pulse counter, scalar ratio meter and oscilloscope. Its advanced programmable logic controllers (PLCs) enable efficient real-time control of the testing process. In addition, the tool provides an automated testing interface, which enables the user to rapidly create, debug and validate the test process. The asset features multiple input/output channels, so that up to eight different device types can be tested simultaneously without any loss of accuracy. Its robust design also helps reduce device failure rates, enabling users to minimize product yields, which is essential in high-volume production and test applications. T 5581 can also be configured to be used in conjunction with other test equipment, such as a robotic model or a scan station. This enables the user to configure the equipment to their exact needs, maximizing productivity and efficiency. Overall, T5581 provides a powerful, flexible and cost-effective solution for device test applications, allowing for high-speed testing of a wide range of devices, with a high level of accuracy and repeatability. It is an ideal system for testing semiconductor devices in production environments and for assessing the reliability and performance of devices before release.