Used ADVANTEST T 5581 #162958 for sale
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ID: 162958
Memory test system
Configuration:
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1.640DR+288I/O
2.960DR+288I/O
3.640DR+576I/O
4.960DR+576I/O [1-4] ............> 4
TH CABLE LENGTH 1.5M
2.8M [1,2] ......................> 1
NUMBER OF TEST HEAD [1,2] ...........................> 1
CONFIGURATION OF TEST HEAD 1
TEST HEAD TYPE 1.816CH
2.1600CH [1,2] .....................> 2
PE BOARD TYPE 0.NO BOARD
1.BGM-021633 (FULL PE)
2.BGM-021633X02 (I/O PE)
3.BGM-021633X03 (DR PE)
SLOT 33 36 39 161 164 167
CHILD A ....> 1 1 1 1 1 1
CHILD B ....> 1 1 1 1 1 1
CHILD C ....> 1 1 1 1 1 1
CHILD D ....> 1 1 1 1 1 1
CHILD E ....> 1 1 1 1 1 1
CHILD F ....> 1 1 1 1 1 1
CHILD G ....> 1 1 1 1 1 1
CHILD H ....> 1 1 1 1 1 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
2'ND DPU : STN 1,2 [Y,N] ..........................> YES
TEST HEAD 1 DC? CONFIGURATION [1-32] .............> 1-20
10V PPS SPEC [1,2] (1:0.4A? 2:0.8A) ......> 2
10V PPS CONFIGURATION [1-64] .............> 1-64
16V PPS CONFIGURATION [33-64] ............>
HV PPS CONFIGURATION [1-4] .............>
1'ST GPIB I/F BOARD 0.NONE.
ADVANTEST T 5581 is a final test equipment designed for the test and measurement of electronic components and sub-assemblies, including semiconductor devices, electronic components and systems. The system comes with a sophisticated user interface, featuring an intuitive graphical user interface (GUI) that allows operators to easily operate the unit and access a wide range of test features and resources. The machine includes a console, an automatic or manual test head, and a variety of test probes and probesets, allowing users to easily configure the tool according to their requirements. The available test head options allow the asset to be adapted to a variety of component types, such as CMOS Integrated Circuits (ICs), Memory ICs, and RF applications. The model is built on the proven architecture of ADVANTEST T 7500 family, which provides flexible, accurate and reliable tests. The eight-channel mainframe offers real-speed operation at high-speed data transfer rates and high throughput, with the ability to effectively test a variety of component types. The equipment allows users to create a variety of test scenarios, and can store up to 30 test programs for easy recall. The test head includes built-in resources such as pulse generators, bias modules and pulse modulation, allowing a range of tests to be performed and accurately characterized. The system also features a wide range of test tools, toolsets, and enhancements, which can be customized to provide powerful capabilities, including full and fractional view tests, pin-limit and over-limit tests, and a variety of test output formats. The unit is designed for a wide range of components and applications, providing reliable and accurate results in a variety of situations. Combined with a rich feature set, ADVANTEST T5581 provides users with the ultimate solution for in-circuit testing.
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