Used ADVANTEST T 5581H #9179691 for sale
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ID: 9179691
Tester
Dual head system
Includes: (2) M6741 Handlers
System configuration generate
Configuration of test head
Pin configuration 1.640DR+288I/O
2.960DR+288I/O
3.640DR+576I/O
4.960DR+576I/O [1-4] ............> 4
TH Cable length 1.5M
2.8M [1,2] ......................> 1
Number of test head [1,2] ...........................> 2
Configuration of test head 1
Test head type 1.816CH
2.1600CH [1,2] .....................> 2
PE Board type 0.No board
1.BGM-021633 (Full PE)
2.BGM-021633X02 (I/O PE)
3.BGM-021633X03 (DR PE)
Slot 33 36 39 161 164 167
Child A ....> 1 1 1 1 1 1
Child B ....> 1 1 1 1 1 1
Child C ....> 1 1 1 1 1 1
Child D ....> 1 1 1 1 1 1
Child E ....> 1 1 1 1 1 1
Child F ....> 1 1 1 1 1 1
Child G ....> 1 1 1 1 1 1
Child H ....> 1 1 1 1 1 1
Configuration of test head 2
Test head type 1.816CH
2.1600CH [1,2] .....................> 2
PE Board type 0.NO BOARD
1.BGM-021633 (Full PE)
2.BGM-021633X02 (I/O PE)
3.BGM-021633X03 (DR PE)
Slot 33 36 39 161 164 167
Child A ....> 1 1 1 1 1 1
Child B ....> 1 1 1 1 1 1
Child C ....> 1 1 1 1 1 1
Child D ....> 1 1 1 1 1 1
Child E ....> 1 1 1 1 1 1
Child F ....> 1 1 1 1 1 1
Child G ....> 1 1 1 1 1 1
Child H ....> 1 1 1 1 1 1
Configuration of DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
2'ND DPU : STN 1,2 [Y,N] ..........................> YES
Test head 1 DC Configuration [1-32] .............> 1-32
10V PPS SPEC [1,2] (1:0.4A 2:0.8A) ......> 2
10V PPS Configuration [1-64] .............> 1-64
16V PPS Configuration [33-64] ............>
HV PPS Configuration [1-4] .............>
Test head 2 DC Configuration [1-32] .............> 1-32
10V PPS SPEC [1,2] (1:0.4A 2:0.8A) ......> 2
10V PPS Configuration [1-64] .............> 1-64
16V PPS Configuration [33-64] ............>
HV PPS Configuration [1-4] .............>
1'ST GPIB I/F Board 0.None
1.BGR-010944X01
2.BGR-010944X02
3.BGR-010944X03
4.BGR-010944X04
5.BGK-012718 [0-5] .........> 0
2'ND GPIB I/F Board 0.None
1.BGR-016793 (DPU I/F)
2.BGR-010944X05
3.BGK-012718X02 [0-3] .........> 1
DMM Type 1.TR6861
2.R6871E
3.R6551
4.R6552T [1-4] .........> 3
AC Frequency (Hz) [50,60] ........................> 60
Configuration OF ALPG
Number OF ALPG [1,2,4] ..............................> 2
Configuration OF DBM
DBM Option exist [Y,N] ..............................> NO
Configuration OF FM
Number OF FM board [0-4] ............................> 0
Pattern memory(PM) board exist [Y,N] ................> NO
End save.
ADVANTEST T 5581H is a high-performance final test equipment that is designed to increase manufacturing efficiency and reduce scrap rates. It provides a unique combination of speed and accuracy that ensures robust test and data collection. It meets the demands of semiconductor manufacturers and a wide variety of Electronic Manufacturing Services (EMS) by efficiently integrating the high-speed test and measuring capabilities with advanced test and management software. ADVANTEST T5581H offers a variety of features for high-speed testing that includes an advanced, modular design that reduces work area requirements and with a large window-style 10" TFT dual display, it ensures a maximum viewing pleasure. It is built with a powerful, high quality Intel-based ATX tower. This architecture enables the system to perform complex tests at over 100 MHz simultaneously while supporting up to 128 individual sites. The flexible architecture of the ELE-OS operating unit also allows for customization of the test processes to optimize efficiency. In addition to the advanced hardware design, T 5581 H offers an array of quality control options. With a variety of test software, it can automatically detect and verify various parameters that are used to analyze performance and output data. Optionally, it can also be used with the ELE-Link software which provides remote access for monitoring and analysis, enabling test managers to quickly access results from anywhere. ADVANTEST T 5581 H is also packed with features such as built-in data logging, nonvolatile memory, and integrated database and management capabilities. It is also designed to seamlessly support a wide range of test equipment such as ATE, thermal, optical, and other specialized high-speed ELIC's. Moreover, it has a number of safety features that include active and passive ESD protection measures, a safety interlock machine, and a self-acting temperature tool. All in all, T 5581H is a perfect solution for testing a wide variety of high-speed, high-performance electronic components before they are shipped out to customers. With its robust capabilities, strong performance, and accurate results, it ensures the highest quality possible and increases manufacturing efficiency, reducing down-time and scrap rates.
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