Used ADVANTEST T 5585 #293634718 for sale

ADVANTEST T 5585 is a high throughput, final test equipment designed for high-volume wafer and unit testing. It is equipped with the latest in APBIT (Advanced Pattern Based In-System Test) technology allowing it to quickly and accurately test and validate complex designs. The unit can process up to 100 wafers and up to 10,000 electronic components per hour, enabling high volumes of throughput in a single pass. The machine consists of several components, including a mainframe, which houses the multiple Integrated Circuit Testing Solutions (ICTS) and DMT (Dielectric Microscopy Testing) systems and a common library for wafer and component management. The tool also includes a programmable switching multiplexer, which allows for simultaneous testing of multiple ICs in parallel, as well as an integrated probe handling asset for unit testing. ADVANTEST T5585 offers high levels of accuracy and repeatability. It is capable of testing complex designs with APBIT technology, which enables checking of up to eight defect modes simultaneously, as well as a rapid test-time of 1.2 s/module. The model provides high-speed defect coverage and can detect double-image, bridging, shorts and open test parameters at a scan frequency of up to 300MHz. T 5585 is designed to provide a high degree of flexibility, with test automation and customization capabilities. It supports a wide range of standards, including MIL-STD-883, JEDEC, and multiple flavors of IEEE 1687. It also supports a variety of test hardware interfacing, such as vectorless and modular pin swap supported by simple wiring connections and easy-to-use graphical user interface. The equipment also offers thermal profiling for wafer level testing, as well as temperature measurement capabilities to ensure that device temperature remains within specified test conditions. Additionally, the system's k-factor Precision Test Management Unit (PTM) enables advanced device characterization and debug capabilities. T5585 is an ideal solution for the highest-speed, highest-precision final test needs. It provides an efficient, accurate, and scalable testing solution for high-volume wafer and unit testing.