Used ADVANTEST T 5585 #9157284 for sale

ADVANTEST T 5585
Manufacturer
ADVANTEST
Model
T 5585
ID: 9157284
Tester Memory DDR2.
ADVANTEST T 5585 is a final test equipment designed for high volume use in wafer-level testing of CMOS and bipolar integrated circuits. This system features an advanced technology platform that enables testing of a wide range of components with high speed and accuracy. ADVANTEST T5585 includes two 16-input Oscilloscope-Voltage Acquisition (O-VA) channels and two Multi-Function Waveform Generator (MFWG) channels. This is combined with 16-Bit, 256MHz architecture for unmatched speed and accuracy. Additionally, T 5585 features two high-speed Multi-Input Digital Measurement Channels (MIDMC) that combine to provide the most versatile and reliable final testing solution available. T5585 features 12-bit resolution at up to 256MHz sampling rate, making it capable of performing measurement and analysis of very high speed analog signals. The unit can conduct 16-channel simultaneous testing at 12-bit and higher, and provides SMD, Flash, and BIST testing support for a wide range of components. ADVANTEST T 5585 comes equipped with advanced trigger capabilities, which include Edge, Glitch, and Pattern triggers. Additionally, the machine provides integrated Waveform Search, with a vast library of search patterns. The tool also offers a suite of Micrometers, Curve Transfer and S-Parameter Measurement capabilities. These are designed for applications requiring accurate component characterization and parameter identification. Additionally, ADVANTEST T5585 offers measurements of device parameter drift, ensuring extremely accurate data collection. T 5585 includes a graphical user interface (GUI) to simplify the learning curve for first-time users. This GUI is highly intuitive, allowing users to quickly configure the asset for specific wafer mapping and characterization. The model also has built-in volumetric accuracy with regular calibration to ensure consistent levels of performance. Overall, T5585 is a powerful, high-speed final test equipment designed for wafer-level testing of CMOS and bipolar integrated circuits. The system is capable of measured and analyzing analog signals and provides numerous advanced features for test, measurement, and analysis. Additionally, the unit offers intuitive user interface with built-in volumetric accuracy and regular calibration for consistent performance.
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