Used ADVANTEST T 5585 #9282374 for sale

ADVANTEST T 5585 is a Final Test equipment specifically designed to accurately test and characterize electronic devices in a manufacturing environment. The system is a highly efficient, high throughput tester which comprises a multi-function station. The unit is equipped with a high-speed tester and powerful software, that together are capable of verifying the performance of individual devices as well as the batch performance of multiple units, which is an important factor in ensuring quality products. Core applications of ADVANTEST T5585 include wafer test, embedded flash memory characterization, machine board and FPGA testing, and small form-factor device testing, among others. The multi-function station includes device testing and debugging,handler control, device in/out capabilities, fault diagnosis, device and tool configuration, and asset data storage. In addition, the model features automated GUI setup for device initializing and power-on-reset, with intuitive feature functions for debugging, testing and analyzing various devices used in various markets. T 5585 has a number of enhanced features, including rapid test coverage setup, fast and accurate characterization on various parameters, simultaneous testing of up to 100 pins, and real-time response testing. In addition, the equipment is capable of concurrent testing of multiple pins, as well as multiple testing of large arrays, which are important for testing and verification. The system also allows for flexible combination of process steps in order to meet specific testing requirements. In conclusion, T5585 offers a comprehensive package of features and functions for improved quality and increased production efficiency. The high-speed tester is able to accommodate a wide range of devices and will prove to be an invaluable asset to the manufacturing process. With its extensive capabilities and easy integration with other environments, ADVANTEST T 5585 is an ideal choice for high-precision and reliable device testing and characterization.