Used ADVANTEST T 5585 #9284195 for sale
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ADVANTEST T 5585 is a final test equipment designed to perform digital, analog, and mixed signal testing. This system is capable of performing highly accurate testing, using a variety of techniques. The unit is built to have an extremely low noise floor and high throughput, making it an ideal candidate for high-volume testing. It has a 500MHz sampling rate and an 80MS/s conversion time, allowing for large-scale testing projects to be completed quickly and accurately. The machine also has an optimized cycle time, so the user is able to produce more results in less time. ADVANTEST T5585 is equipped with 8 test channels, which can be used to test all kinds of different materials. It allows for various combinations of device types, including analog, digital, or mixed signal. This is beneficial for production lines that need to test multiple different devices on the same tool. The asset features customizable test modes, allowing the user to set parameters specific to their needs. It also has user-defined test points and functional test patterns to analyze devices. This allows the user to isolate and analyze components to diagnose problems. The model offers different levels of integration, making it easy to interfacing with other test systems and integrating tests into a design environment. It also supports multiple test instruments, allowing the user to test multiple components simultaneously. The equipment is designed with advanced fault detection and troubleshooting capabilities. It has a trouble shooting matrices, self-test capabilities, and simulation aids to identify and diagnose the root cause of an issue. In addition to these features, T 5585 has advanced thermal testing capabilities, allowing the user to examine temperature effects on a system or component. It also has extensive test library and test programs, which greatly reduces testing time. Overall, T5585 is an excellent solution for any type of testing needs. Its advanced features and flexibility make it an essential component for any test environment.
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