Used ADVANTEST T 5585 #9291280 for sale

ADVANTEST T 5585 is a high-end, automatic and reliable final test equipment from ADVANTEST Corporation. ADVANTEST T5585 features a powerful, dedicated high-speed FPGA-driven pin electronics in a compact, single ATE box, minimizing test cycle time and providing high test throughput. It is designed with a 5-dimensional Vectorless Tester that performs true-parallel pattern execution, application-specific algorithm support, as well as control and measurement precision at the pin level. The system is equipped with a parallel library that enables fast, accurate pattern generation and direct measurement, while it applies short-pulse-time testing, JTAG/CJTAG solutions, and offers in-slot testing and instrumentation to accurately diagnose defects. T 5585 has an extensive built-in automation unit for reducing test setup time and for maximizing test coverage. Its machine automation enables cost-effective, fast parameter measuring and DFT coverage solutions. This tool also features on-the-fly pattern parameter adjustment and cross-platform memory replica testing for easy debugging. Its distributed architecture allows multiple operators to work simultaneously to meet production line demands, and its offline diagnostics give users the freedom to test devices at any remote location. T5585 also has a user-friendly, robust software platform for creating customer-specific test solutions. Using an intuitive graphical user interface, customers can quickly develop complex customer tests, assess results, and analyze device data. The asset's test software libraries provide multiple probing solutions and customizable user interfaces, making device evaluation and validation easy. In conclusion, ADVANTEST T 5585 Final Test Model is a powerful and reliable equipment, with outstanding performance and a long product life, offering comprehensive and cost-effective test solutions. It is user friendly, with multiple probing solutions, adaptable to worldwide consumer demands, and designed to help customers quickly assess results and analyze device data.