Used ADVANTEST T 5585 #9351974 for sale

Name: ADVANTEST T 5585
Brand: ADVANTEST
SKU: 9351974
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5585

ID: 9351974

Memory tester SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD NUMBER OF TEST HEAD [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 NORMAL PIN CONFIGURATION 1 1 1 1 1 1 1 1 2 2 2 2 3 3 4 4 4 9 0 0 0 6 6 6 7 7 2 2 3 3 3 7 1 5 9 7 1 5 9 1 5 9 3 7 5 9 3 7 CHILD A-D : Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y CHILD E-H : Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y DRIVER OPTION PE CHILD A-D : NO CHILD E-H : NO CONFIGURATION OF TEST HEAD 2 NORMAL PIN CONFIGURATION 1 1 1 1 1 1 1 1 2 2 2 2 3 3 4 4 4 9 0 0 0 6 6 6 7 7 2 2 3 3 3 7 1 5 9 7 1 5 9 1 5 9 3 7 5 9 3 7 CHILD A-D : Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y CHILD E-H : Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y DRIVER OPTION PE CHILD A-D : NO CHILD E-H : NO CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-64] .............> 1-64 PPS CONFIGURATION [1-256] ............> 1-64,97-192,225-256 TEST HEAD 2 DC CONFIGURATION [1-64] .............> 1-64 PPS CONFIGURATION [1-256] ............> 1-64,97-192,225-256 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF ALPG NUMBER OF ALPG [1,2,4] ..............................> 2 CONFIGURATION OF DBM DBM OPTION EXIST [Y,N] ..............................> NO CONFIGURATION OF FM NUMBER OF FM BOARD [0,2,4,8] ........................> 4 NUMBER OF AFM MODULE [0,8] ..........................> 8 SIZE OF AFM BOARD [1-2] [1:4M 2:16M] ...............> 1 PATTERN MEMORY(PM) BOARD EXIST [Y,N] ................> NO END SAVE.

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ADVANTEST T 5585 is a high-performance Final Test Equipment for semiconductor devices such as MCUs, memories, and other types of integrated circuits. It is equipped with a high-speed and high-accuracy high-throughput handler with a capacity of up to 5,000 devices per hour. ADVANTEST T5585's optimized design improves productivity for final test and makes it more effective for wafer probing applications. T 5585 integrates both Silicon (SIL) and Equipment Under Test (EUT) solutions in one platform, which provides an easy-to-use framework for device and procedure customization. It comes with powerful hardware and intelligent software features, allowing the user to configure test sequences and accurately analyze results. The system is also equipped with a Device Programming Module, providing a comprehensive set of software tools for device programming, test pattern generation, flash & eprom erasing, and device programming. The unit is capable of a wide range of tests for quality control, reliability testing, and functional test. It supports standard digital tests such as boundary scan, timing measurements, power analysis, and more. It also supports AC and DC analog test functions. T5585 comes equipped with various different platforms for testing, each of which has a configurable circuit structure and can support up to 256 signals. ADVANTEST T 5585 offers reliability measurements such as module testing, design analysis, die shelf life testing, electrical leak testing, and temperature cycling. It also supports device laser marking and labelling. ADVANTEST T5585 is a highly automated test machine. It features a Work Table Manager that creates separate processes for device loading, unloading, and test execution. The ZERO-EL operator screen provides support for editable test recipes, device graphical data, and various other key information. The tool is also compatible with various error handlers and other tools. T 5585 is designed to meet the demands of any single or multi-site wafer-probing application. Built on a stable and reliable platform, it is guaranteed to deliver accurate and reliable results. It comes with a host of advanced features and capabilities, making it the perfect solution for any testing or quality control need.