Used ADVANTEST T 5586 #9075036 for sale
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ID: 9075036
Tester
TEST RATE 500Mhz
SYSTEM SOFTWARE ASX/U-51
VERSION 6.03-2
CPU TYPE SUN Blade 150
PIN CONFIGURATION 1536DR + 1152IO/STN
HIGH SPEED CLK CHANNEL 64/STN
DC ONLY CHANNEL 128/STN
TIMINNG SET 16
DATA BUFFER MEMORY 256KW X 80BIT
INSTRUCTION MEMORY 1KW
TEST HEAD 2
CONFIGURATION DPU 1'ST DPU 2'ND DPU
DC CONFIGURATION 1-64
DEVICE POWER SUPPLY 10V PPS SPEC 0.8A
10V PPS SPEC 1-192
1'ST GPIB I/F BOARD BGR-022449
2'ST GPIB I/F BOARD BGR-024498
DMM TYPE R6552T-R
AC FREQUENCY(HZ) 60
CONFIGURATION OF ALPG 2EA X=16,Y=16
CONFIGURATION OF DBM no
CONFIGURATION OF FM yes.
ADVANTEST T 5586 is a sophisticated and efficient final test system designed to provide greater quality and reliability in the manufacturing of electronic semiconductor products. The system is versatile and includes several testing options, including the Automatic Test Program Generator (ATPG) module, the Core Test Module (CTM), the Transistor-Mixer-Shift Comparator (TMSC) module, the Environmental Stress Test (EST) module, and the Advanced Monitor Mode (AMM) module. The ATPG module is designed to generate tests that accurately stress the various operations of a manufactured device. It is capable of generating complex test patterns that represent realistic conditions for testing the reliable operation of devices. In addition, this module also present comprehensive analysis of parameter measurements gathered during tests. The CTM module is a highly automated testing resource for semiconductor products. It features an open architecture design that makes it accessible for users of various programming languages and logic designs. The module is designed to automate testing from board to board, using an embedded processor to interpret the test patterns and supply a set of core test commands. The CTM module also offers a wide range of tests such as design-for-testability (DFT) tests, as well as specialised tests that may be necessary for a product. The TMSC module is a combined TMS (Transistor-Mixer-Shift) device and Comparator module. It is designed to provide a reliable, accurate, and robust method for measuring logic signals and components in high speed applications. The module is powered by a triple DIO (Digital Input Output) architecture, allowing for concurrent testing of up to three devices. This module also features an error detecting and correcting system to ensure accurate test patterns are produced. The EST module is designed to enable users to test semiconductor components in extreme temperature, pressure, and humidity conditions. This module is capable of testing components in environment conditions between -40C and +120C at pressures up to 180 MPa (millibars). Furthermore, the EST module can reach +99%RH within 30 minutes and is capable of switching between environment ratings with a single command. Finally, the Advanced Monitor Mode (AMM) module monitors the production process of device manufacturing, ensuring quality devices are being produced in accordance with set standards. This module can detect errors and deviations from the production process and alert operators of the problem. This information can be used to improve the quality control process, improving the efficiency and reliability of the manufacturing process.
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