Used ADVANTEST T 5588 #9172819 for sale
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ID: 9172819
Testers
(1) ADVANTEST M6241 Handler
System: System name = T5588 > T5588
System: Each machine name = QIMC5 > QIMC5
System: AC Power line frequency (Hz) = 50 > 50
TH: NUMBER OF TH = 1 > 1
TH: PE CONFIGURATION TH1 SLOT 33 41 97 105 33 41 97 105
[0:NOT EXIST 1:EXIST] A1 = 1 1 1 1 > 1 1 1 1
E1 = 1 1 1 1 > 1 1 1 1
A3 = 1 1 1 1 > 1 1 1 1
E3 = 1 1 1 1 > 1 1 1 1
A5 = 1 1 1 1 > 1 1 1 1
E5 = 1 1 1 1 > 1 1 1 1
A7 = 1 1 1 1 > 1 1 1 1
E7 = 1 1 1 1 > 1 1 1 1
DP: PPS CONFIGURATION TH1 = 1-512 > 1-512
DP: DC CONFIGURATION TH1 = 1-64 > 1-64
DP: HVPPS CONFIGURATION TH1 = 1-128 > 1-128
ALPG: NUMBER OF ALPG [1,2] = 2 > 2
FM: NUMBER OF FM [0,2,4] = 0 > 0
FM: NUMBER OF PM [0,1] = 0 > 0
FM: NUMBER OF DBM [0,1,2] = 0 > 0
OPTION: FLASH OPTION [Y/N] = NO > NO
OPTION: HIGH SPEED OPTION [Y/N] = NO > NO.
ADVANTEST T 5588 Final Test is an automated wafer test equipment designed to streamline the task of testing hundreds to thousands of wafers at once in a single operation. It consists of three main components: an on-board automated electrical measurement system (AMEMS), an automated loading and unloading station, and a post-test de-panelization unit. The AMEMS unit includes a powerful controller, speech recognition sensor, 3D vision sensor, and data acquisition machine. The controller is responsible for generating and driving the electrical test signals through the wafer and analyzing the results. The speech recognition sensor ensures that the tool can accurately understand instructions given by the operator, while the 3-D vision sensor provides positional awareness for the asset to ensure perfectly accurate test positioning. The data acquisition model collects and organizes data from the tests into electronic files for later review. The automated loading and unloading station is the interface between the wafers and ADVANTEST T5588 Final Test. It features a robotic arm and conveyor equipment that allows the system to move wafers quickly and safely from the loaded trays to the AMEMS and back. The unit also incorporates a quick-change feature which ensures that the robot can quickly and smoothly swap out trays without slowing down the testing process. The post-test de-panelization unit is the final step in the testing process. It is responsible for breaking the wafers into individual chips and sorting them into bins. This step ensures that the chips can be easily shipped or stored after the test is complete. T 5588 Final Test is designed to provide a fast, accurate, and reliable wafer testing process. The machine is highly flexible and can easily be adapted for different types of wafers and testing scenarios. The automated loading and unloading station and post-test de-panelization unit ensure quick turnaround times while the 3-D vision sensor and data acquisition tool provide highly accurate results. All of these features make T5588 Final Test an ideal choice for high volume wafer testing.
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