Used ADVANTEST T 5592 / M 6541AD #104207 for sale

ADVANTEST T 5592 and M 6541AD Final Test Systems are automated semiconductor test solutions that combine the best in industry-standard parallel tester technology with the powerful features of VLSI circuit testing. Utilizing Parallel Test Drive (PTD) technology, a highly efficient method of testing multi-chip devices, this equipment provides a fast and reliable solution for device testing and diagnostics. The system allows for the simultaneous collection of multiple test data types in a single testing cycle, such as logic, analog or timing, providing comprehensive testing of all aspects of unit functionality in a single pass. The T 5592 is a full-featured automatic tester that offers a host of features and configuration options. Its machine-level test program architecture, combined with diagnostic capabilities, delivers maximum speed and accuracy for production test applications. It contains a multi-processor-controlled, 8-bit core for rapid running of the test program, each processor in the tool having 16 or 32 DUT channels. The asset is equipped with a Dual-Laser interface that provides complete control, status and configuration of up to 1008 devices. A built-in graphical user interface (GUI) makes it easy to identify and control the model parameters. The M 6541AD model features a VLSI microprocessor core with a 16-bit RISC processor to run the standard suite of VLSI drivers, providing increased test coverage and test speeds. Its stacked wafer bonder gives a more compact form factor, while the dual lifecycle test interfaces offer added ease-of-use in multiple production environments. The equipment is compatible with an optional 40/60GHz frequency hopping system to test both high-speed and ultra-high-speed memory devices. For efficient test throughput, the unit supports multiple tests per DUT with up to 10 dedicated test heads for each die. Additionally, the machine's Fault Isolation Tool (FIS) support allows for rapid fault isolation and fast troubleshooting of defects down to the wafer level. The T 5592 and M 6541AD systems provide an efficient and cost-effective solution for device testing and diagnostics in premium production environments. This automated test asset offers high performance, great flexibility, and robustness for highly complex VLSI applications. Combining powerful features, advanced test capabilities and versatile configuration options, the T 5592 and M 6541AD provide unmatched performance and reliability.