Used ADVANTEST T 5592 #136077 for sale
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ID: 136077
Memory tester with M6751AD handler
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/DIAG/G
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1.144DR+192I/O
2.288DR+384I/O
3.576DR+768I/O? [1,2,3] ...........> 3
NUMBER OF TEST HEAD? [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
PE1 ( 1 - 6 , 19 , 33 - 38 ,51 , 52 ) CHILD A/B/C/D .....> YES
PE2 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD A/B/C/D .....> YES
PE3 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD A/B/C/D .....> YES
PE4 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD A/B/C/D .....> YES
PE5 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD A/B/C/D .....> YES
PE6 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD A/B/C/D .....> YES
PE7 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD A/B/C/D .....> YES
PE8 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD A/B/C/D .....> YES
PE9 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD A/B/C/D .....> YES
PE10 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD A/B/C/D .....> YES
PE11 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD A/B/C/D .....> YES
PE12 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD A/B/C/D .....> YES
PE13 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD E/F/G/H .....> YES
PE14 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD E/F/G/H .....> YES
PE15 ( 13 - 18 , 21 , 45 -50 , 55 , 56 ) CHILD E/F/G/H .....> YES
PE16 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD E/F/G/H .....> YES
PE17 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD E/F/G/H .....> YES
PE18 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD E/F/G/H .....> YES
PE19 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD E/F/G/H .....> YES
PE20 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD E/F/G/H .....> YES
PE21 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD E/F/G/H .....> YES
PE22 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD E/F/G/H .....> YES
PE23 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD E/F/G/H .....> YES
PE24 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD E/F/G/H .....> YES
CONFIGURATION OF TEST HEAD 2
PE1 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD A/B/C/D .....> YES
PE2 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD A/B/C/D .....> YES
PE3 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD A/B/C/D .....> YES
PE4 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD A/B/C/D .....> YES
PE5 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD A/B/C/D .....> YES
PE6 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD A/B/C/D .....> YES
PE7 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD A/B/C/D .....> YES
PE8 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD A/B/C/D .....> YES
PE9 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD A/B/C/D .....> YES
PE10 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD A/B/C/D .....> YES
PE11 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD A/B/C/D .....> YES
PE12 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD A/B/C/D .....> YES
PE13 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD E/F/G/H .....> YES
PE14 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD E/F/G/H .....> YES
PE15 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD E/F/G/H .....> YES
PE16 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD E/F/G/H .....> YES
PE17 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD E/F/G/H .....> YES
PE18 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD E/F/G/H .....> YES
PE19 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD E/F/G/H .....> YES
PE20 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD E/F/G/H .....> YES
PE21 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD E/F/G/H .....> YES
PE22 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD E/F/G/H .....> YES
PE23 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD E/F/G/H .....> YES
PE24 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD E/F/G/H .....> YES
CONFIGURATION OF DPU
TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32
10V PPS CONFIGURATION [1-128] ......> 1-128
TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32
10V PPS CONFIGURATION [1-128] ......> 1-128
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF ALPG
NUMBER OF ALPG [1,2,4] ..............................> 4
ONFIGURATION OF PDS
NUMBER OF CYCLE PALETTE? [8,16] ......................> 8
CONFIGURATION OF DBM
DBM OPTION EXIST? [Y,N] ..............................> YES
SIZE OF DBM BOARD? [1-2] [1:256K? 2:1M] ..............> 2
CONFIGURATION OF FM
NUMBER OF FM BOARD? [0,4,8] ..........................> 0
END SAVE
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/LOG OFF
ADVANsite Software Product Information? 08-APR-2009 08:52:21
System Software : ASX/U-51
Version : 6.00A1
CPU Type : SPARC
Product P number Revision [Expected] Date Label
Title
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ASXUBASE PASX51-92**** 2.03 [ ] 01-DEC-1989 ROOT
SunOS Release 5.7
ATW51SU PASX51-92**** 6.00A [ ] 28-JAN-2002 ATLW51
ATLworks for T5500 Series
DIAG5592SU PASX51-92**** 1.05B [ ] 15-MAY-2002 DG5592
Tester Diagnosis (T5592)
ICD51SU PICD51-00**** 1.03 [ ] 02-NOV-2000 ICD51
ICD/U-51 One Line Compiler
MPEDIT51SU PMPE51-00**** 1.02 [ ] 02-NOV-2000 MPE51
MPEDIT/U-51 Memory Pattern Editor
SYSTEST51SU PASX51-92**** 6.00A1 [ ] 06-MAR-2002 SYST51
ADI/SYS TEST (T5581 Series)
TESTUTL51SU PASX51-92**** 6.00A1 [ ] 06-MAR-2002 TUTL51
Tester Utilities (T5581 Series)
WBMA51SU PWBM51-00**** 4.01 [ ] 31-JAN-2001 WBMA51
Workbench-M2 for T5500 Series (Analysis Tools)
WBMW51SU PWTR51-00**** 4.01 [ ] 08-FEB-2001 WBMW51
Workbench-M2 for T5500 Series (WaveTracer2)
XATL51SU PXTL51-00**** 5.04A [ ] 08-MAR-2001 XATL51
XATL/U-51 Cross Compiler.
ADVANTEST T 5592 is a final test equipment which is designed to perform a variety of tests on a variety of devices quickly and efficiently. It enables precise and automated testing of a wide range of components and features, including digital logic circuits and analog devices. This system employs a high-speed, dual-stage testing technology, which has been designed to deliver fast and accurate testing for products that require quality-oriented performance. At the core of T 5592 is its advanced testing technology. This unit uses dual-stage testing to ensure more accurate results. During the first stage of the testing process, the machine is able to detect and analyze devices, enabling detailed analysis and incident response. The second stage of testing involves a parallel architecture that is able to rapidly detect, analyze, and compare devices; this results in rapid testing and even faster corrections. Furthermore, the tool is also able to access a large database of component information, allowing for further analysis and comparison. Furthermore, ADVANTEST T 5592 also offers enhanced GPRS test capability, with full remote access and logging capabilities. Its GPRS testing feature allows users to quickly and accurately test a variety of GPRS products with multiple stages of tests. The asset also offers comprehensive visualization of result data with real-time graphs and charts that offer a comprehensive measurement of device performance. In terms of its use, T 5592's dual-stage testing facilitates both component and model-level testing, allowing for performance optimization and quality control. This equipment's ability to access and analyze device information in real-time makes it an ideal solution for product development, providing valuable insight into device design and performance. Additionally, the system can be used for in-circuit and functional testing, to ensure reliable operation and quality in devices. Overall, ADVANTEST T 5592 is an advanced test unit whose features and capabilities enable precise and efficient testing of multiple products. Its dual-stage testing, GPRS test capability, and real-time data analysis make it an ideal choice for product development and in-circuit testing. This machine's performance optimization and quality control features ensures reliable and accurate results for a variety of components and devices.
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