Used ADVANTEST T 5592 #163116 for sale

Name: ADVANTEST T 5592
Brand: ADVANTEST
SKU: 163116
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5592

ID: 163116

Memory tester CONFIGURATION: (1 Test Head with Full Configuration) SYSTEM CONFIGURATION GENERATE CONFIGURATION: (1 Test Head with Full Configuration) SYSTEM CONFIGURATION GENERATE PIN CONFIGURATION 1. 144DR+192I/O 2. 288DR+384I/O 3. 576DR+768I/O [1,2,3] ...........> 3 NUMBER OF TEST HEAD [1,2] ......................................> 1 CONFIGURATION OF TEST HEAD 1 PE1 (1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD A/B/C/D ..........> YES PE2 (7 - 12 , 20 , 39 - 44 , 53 , 54) CHILD A/B/C/D ..........> YES PE3 (13 - 18 , 21 , 45 - 50 , 55 , 56) CHILD A/B/C/D .........> YES PE4 (65 - 70 , 83 , 97 - 102 , 115 , 116) CHILD A/B/C/D ......> YES PE5 (71 - 76 , 84 , 103 - 108 , 117 , 118) CHILD A/B/C/D .....> YES PE6 (77 - 82 , 85 , 109 - 114 , 119 , 120) CHILD A/B/C/D .....> YES PE7 (129 - 134 , 147 , 161 - 166 , 179 , 180) CHILD A/B/C/D ..> YES PE8 (135 - 140 , 148 , 167 - 172 , 181 , 182) CHILD A/B/C/D? .> YES PE9 (141 - 146 , 149 , 173 - 178 , 183 , 184) CHILD A/B/C/D? .> YES PE10 (193 - 198 , 211 , 225 - 230 , 243 , 244) CHILD A/B/C/D .> YES PE11 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD A/B/C/D.> YES PE12 (205 - 210 , 213 , 237 - 242 , 247 , 248) CHILD A/B/C/D .> YES PE13 (1 - 6 , 19 , 33 - 38 , 51 , 52) CHILD E/F/G/H .............. YES PE14 (7 - 12 , 20 , 39 - 44 , 53 , 54) CHILD E/F/G/H? ..........> YES PE15 (13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD E/F/G/H .......> YES PE16 (65 - 70 , 83 , 97 - 102 , 115 , 116) CHILD E/F/G/H ......> YES PE17 (71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD E/F/G/H......> YES PE18 (77 - 82 , 85 , 109 - 114 , 119 , 120) CHILD E/F/G/H ......> YES PE19 (129 - 134 , 147 , 161 - 166 , 179 , 180) CHILD E/F/G/H ..> YES PE20 (135 - 140 , 148 , 167 - 172 , 181 , 182) CHILD E/F/G/H ..> YES PE21 (141 - 146 , 149 , 173 - 178 , 183 , 184) CHILD E/F/G/H ..> YES PE22 (193 - 198 , 211 , 225 - 230 , 243 , 244) CHILD E/F/G/H ..> YES PE23 (199 - 204 , 212 , 231 - 236 , 245 , 246) CHILD E/F/G/H .> YES PE24 (205 - 210 , 213 , 237 - 242 , 247 , 248) CHILD E/F/G/H ..> YES CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32 10V PPS CONFIGURATION [1-128]......> 1-128 AC FREQUENCY (Hz) [50,60] ..................................> 50 CONFIGURATION OF ALPG NUMBER OF ALPG [1,2,4] ..........................................> 4 ONFIGURATION OF PDS NUMBER OF CYCLE PALETTE [8,16] ...........................> 8 CONFIGURATION OF DBM DBM OPTION EXIST[Y,N] ..........................................> YES SIZE OF DBM BOARD [1-2] [1:256K? 2:1M] ..................> 2 CONFIGURATION OF FM NUMBER OF FM BOARD [0,4,8] ...................................> 4 NUMBER OF AFM MODULE [0,8] ..................................> 8 SIZE OF AFM BOARD [1-2] [1:4M] 2:16M] .....................> 1.

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ADVANTEST T 5592 is a final test equipment for semiconductor chips. It is designed for wafer and device level testing of high-Pin-Count (HPC) microprocessors, memories and other devices that require a large number of data and electrical test pins. T 5592 system is a great solution for device manufacturers that require fast and efficient testing process. ADVANTEST T 5592 offers total testing capabilities through integrated architecture. This unit has a combination of Maximus software and VectorStar hardware that are able to control device testing, interfaces, control and results analysis. The Maximus software provides parallel testing of up to 32x, allowing users to reduce testing time and cost. One of the main features of T 5592 machine is its scalable design, able to test up to 512 pins. The tool enables full parametric and functional tests, using its high-speed I/O and high-resolution ADC capabilities. It also offers multiple test modes, including pre-test modes for wafer level testing, and device replacement, repair and characterization to maximize test throughput. ADVANTEST T 5592 offers the highest possible sensing resolution for the device test, supporting maximum accuracy and quality assurance. Data platform Asset-on-Chip testing is also provided with its high-speed testing capabilities. It also offers built-in high-speed test algorithm libraries that allow for high parallelism and quick test implementation of power, impedance, and other high-speed tests. The main benefit of T 5592 is that it offers high quality test results that are repeatable and consistent. This means that device manufacturers can trust the results of their device tests. The model is also capable of adapting to changes in design and fabrication, making it a great choice for high-end testers. With its integrated architecture and scalable design, ADVANTEST T 5592 offers fast and efficient testing, helping device manufacturers stay ahead in the highly competitive semiconductor testing market. This equipment is the perfect solution for high-quality and high-precision testing of semiconductor devices.