Used ADVANTEST T 5593 #9123594 for sale

ADVANTEST T 5593 Final Test Equipment is an integrated test solution specifically designed for production integration of Semiconductor Devices. It combines high-speed IO test capabilities with exceptional programmability and flexibility to ensure accurate testing of complex semiconductor devices. The system also offers a comprehensive set of advanced features to maximize testing power, throughput and support of today's contemporary devices. ADVANTEST T5593 is equipped with precisely tuned programmability and flexibility to enable precise test results. It features a multiport, 54-pin interface to accommodate parts with high pin counts and a broad range of connection types. In addition, T 5593 provides multiple program options, including multiple programming protocols and test algorithms. This gives users the flexibility to program devices with greater accuracy and shorter test time. The unit includes full support for multi-chip testing and hierarchical network testing for faster Total Device Test (TDT). T5593 is designed for high-speed testing, with data throughputs of up to 1.3 Gb/s and speeds of up to 400 MHz. It includes multiple arb/force triggers and memory controller functions to provide sophisticated test solutions for today's complex parts. The machine also provides a full range of scan, boundary scan and functional test capabilities. ADVANTEST T 5593 has a powerful set of features that have been developed to improve test efficiency and reliability. It includes an integrated test monitor and automatic test application (ATA) to simplify test scheduling and debugging. Additionally, its multi-channel sequencer provides a flexible companion for automated testing programs. It also offers IEEE 1149.1-compatible source drivers that enable up to 16-channel data acquisition operations. The tool features a modular architecture that offers scalability and future-readiness. The asset is scalable in terms of algorithm and features to allow for upgradeability as devices evolve. It includes a host interface that provides easy connectivity with external systems. ADVANTEST T5593 also offers extensive runtime and memory resources for the greatest number of applications. T 5593 Final Test Model is an effective high-density testing solution for the next generation of Semiconductor Devices. It offers users a powerful integrated test solution that provides precise pin-level fault detection, high-speed IO and memory support, and superior programmability and flexibility. With its modular architecture and comprehensive set of features, T5593 is an ideal solution for optimizing test coverage, reducing costs, and improving performance in a growing competitive market.