Used ADVANTEST T 5593 #9123623 for sale

ADVANTEST T 5593 is a final test equipment designed to inspect and verify wafers used in IC production. The system contains several components, which provide high-speed electrical testing of the contacts and transistors on the IC to ensure that it is of a high quality. The unit features a high-precision substrate stage which houses the tested wafer during the test process, this stage is capable of rotating the substrate to accurately align each contact pad to the test pin. The high-speed test pins, commonly referred to as Peel-Off Probes, enable lightning fast testing of the IC contact pads, providing detailed electrical partitioning of the wafer grid. ADVANTEST T5593 also features a testing software package which can interact with the on-board controller and process test results in real-time. This machine is capable of testing up to 2 chips at a time, providing accurate diagnostic data for complex designs with multiple inputs and outputs. The process of final testing with T 5593 is as follows; the test patterns can be programmed in the software package prior to placing the wafer onto the substrate stage. The controller on the tool will then initiate the test process, controlling the stage and providing feedback to the test pins as they measure the electrical parameters of each contact pad. Once the testing is complete, the results will be stored on the asset and can be used for further analysis and comparison against predetermined test specifications. T5593 is ideal for use in IC manufacturing and quality control, as it is capable of extremely rapid testing with highly accurate results. Its dual chip testing also provides significant time savings for complex designs, and its high-precision substrates ensure accuracy and repeatability.