Used ADVANTEST T 5593 #9316700 for sale
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ID: 9316700
Tester
(2) M6542AD
/DIAG/G
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
NUMBER OF TEST HEAD [1,2] ..........................> 2
CONFIGURATION OF TEST HEAD 1
(0:NOT EXIST 1:NORMAL BOARD 2:HSC BOARD)
1 1 1 1 1 1 1 2 2 2 2
3 3 4 5 9 0 0 1 6 6 7 7 2 3 3 4
3 9 5 1 7 3 9 5 1 7 3 9 5 1 7 3
A A A A A A A A A A A A A A A A
CHILD A1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
CHILD A3 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
CONFIGURATION OF TEST HEAD 2
(0:NOT EXIST 1:NORMAL BOARD 2:HSC BOARD)
1 1 1 1 1 1 1 2 2 2 2
3 3 4 5 9 0 0 1 6 6 7 7 2 3 3 4
3 9 5 1 7 3 9 5 1 7 3 9 5 1 7 3
A A A A A A A A A A A A A A A A
CHILD A1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
CHILD A3 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
CONFIGURATION OF DPU
TEST HEAD 1 DC CONFIGURATION [11- 64] ...........> 1-64
10V PPS CONFIGURATION [1-320] ...........> 1-320
TEST HEAD 2 DC CONFIGURATION [11- 64] ...........> 1-64
10V PPS CONFIGURATION [1-320] ...........> 1-320
AC FREQUENCY (Hz) [50,60] ...........> 60
CONFIGURATION OF ALPG
SUBALPG OPTION EXIST [Y,N] .........................> NO
CONFIGURATION OF PDS
SUFFIX OF PDSDR [1 :NONE,2:X02] .....................> 1
CONFIGURATION OF DBM
DBM OPTION EXIST [Y,N] .............................> NO
CONFIGURATION OF FM
NUMBER OF FM BOARD [0,2,4,8] ........................> NO
SIZE OF FM BOARD [1:2Q2:4G] ......................> NO
FM ADDRESS DELAY [1:0-7,2:0-15] ...................> NO
CONFIGURATION OF SC
DQS ANALIZER OPTION EXIST [Y,N] ....................> NO
ENDSAVE
=
/LOG OFF.
ADVANTEST T 5593 is a highly advanced final test equipment for integrated circuits (ICs). It offers numerous features and benefits to enable efficient hardware testing and evaluation. The system comprises a controller and an associated board for test socket control. It provides support for a wide range of IC packages, including through-hole and surface-mount devices, making it suitable for most test requirements. The controller features 16 channels, operating at up to 500 MS/s per channel. It also includes an advanced digital-to-analog converter (DAC) to provide the signals necessary for testing high-frequency ICs. The test unit is capable of precise timing and signal trace acquisitions from 0.1 Hz up to 500 MHz. The test machine also offers a range of advanced test features, such as an on-board library for automation and programming, extended memory options, script control capabilities, and more. It supports a variety of test instrumentation, such as oscilloscopes, logic analyzers, and network analyzers, as well as powerful analysis and simulation tools. The tool also includes a highly automated test cell which allows the execution of tests with minimum manual intervention. All the tests are modular, ensuring easy test maintenance. The test asset can be additionally configured for integrating with other peripherals and machines, for highly automated production tests. ADVANTEST T5593 provides an effective and efficient way to test and evaluate ICs. It allows for precise timing measurements, as well as advanced test features for automated testing. The model can be integrated into production lines, providing reliable and consistent results. It is suitable for most test requirements, and its powerful test library ensures that it remains a highly efficient and effective tool.
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