Used ADVANTEST T 5723 #9177972 for sale

ADVANTEST T 5723 Final Test Equipment is an efficient and reliable automated test system developed for testing a variety of integrated circuit (IC) devices. The unit is designed to provide comprehensive 'high-speed, final test' for large-scale integrated circuits such as DRAM, SRAM, Flash memory, logic ICs, CPLDs, FPGAs, and other complex ICs. It supports a wide range of testing parameters and can test multiple devices simultaneously at high speeds. The machine provides a cost-effective, simple to operate, and flexible solution to busy IC test environments that may require routine testing or higher levels of complexity. It is scalable to meet individual needs, and can be easily adapted to most IC architectures. The tool uses multiple test heads and electronics units to provide flexibility and efficiency for final testing. It can support 130 testers per asset, and multiple systems can be linked together to increase high-speed testing capabilities. The test model is also available with various optoelectronic interface modules to facilitate equipment testing. T 5723 comes equipped with powerful features such as its Data-Focused workflow, which provides maximum fine tuning for test parameters and allows users to find desired test results quickly and accurately. Its automated setup allows for faster and more accurate test development, and its powerful Digital Pattern Generator (DPG) allows for simultaneous high-speed testing of multiple devices. The system also has several built-in test libraries and can automatically detect the type of device being tested. ADVANTEST T 5723 also includes the Advanced Measurement Analysis software, which provides users with real-time data and analysis capabilities. T 5723 Final Test Unit is a reliable, cost-efficient, and user-friendly automated test machine suitable for a range of applications. It provides a reliable testing solution with high-speed testing capability and a range of automated features and test libraries to help users customize their tests. The tool is easily configurable to suit most IC architectures and provides a flexible way to get accurate and reliable results.