Used ADVANTEST T 5723ES #9155947 for sale

Manufacturer
ADVANTEST
Model
T 5723ES
ID: 9155947
Testers Flash memory testing Test station: (8) Site channels configuration: (Dr: 9ch + I/O: 9ch) / Site Set trigger terminal TEL / TOKYO ELECTRON P-12XL Prober Measurement section: DC Test unit: PMU Ch/site Programmable power supply PPS (Vcc,Vccq,Vpp,Vnn): (4) Ch/Site Timing generator: Number of timing edges: BCLK: 1-8 CCLK: 1-8 STRB: 1-2 (16) Timing sets Pattern generator ALPG: X Register - 16 bits Y Register - 16 bits Z Register - 16 bits (8) Pairs driver output reference levels (VIH, VIL) (8) Pairs comparator input reference levels (VOH, VOL) Failure analysis memory: (16 Mbits / Site) Pattern memory: (16 Mbits / Site) Down flow mainframe Control section Tester processor: Celeron-LP / 400MHz Memory capacity: 256 MBytes PC work station CPU (Xeon): H3-610086 Memory capacity: 512 MBytes 40GB Hard disk Ethernet 10 / 100 Base T port CD-ROM / RW Drive 3.5" Floppy disk drive: 1.44 MB LCD Monitor (17"): H3-610085 (2) Sets GP-IB interface: H3-610067 Peripherals: 10/100 Base T cable network connection: Cable (15m): H3-6628X03 Desk system: H9-110034/H3-710114 Photoelectric smoke sensor Additional EMO switch Without-key type: H3-XXXXX Accessories: Standard accessories GP-IB cable: H3-610131 Contact check board: SH7-010053 System ratings: Power line voltage: Line: 180 - 220 VAC (20 A, 3-phase power source) (2) Lines: 120 V + /-10% (Single phase power source) Power line frequency: 60 Hz +/-0.5% Power consumption maximum: 2.8 kVA Country kit: A H3-710105.
ADVANTEST T 5723ES is a Final Test equipment engineered for the highest level of reliability and performance. This system is the industry leader in testing technology, providing comprehensive testing solutions for a wide range of semiconductor devices. T 5723ES unit offers several unique and reliable features that make it an ideal choice for a Final Test machine. This tool is designed to test single-chip devices, and has the capability to test both analog and digital semiconductor devices. ADVANTEST T 5723ES asset is equipped with an integrated design, enabling it to detect and correct the most challenging data failures without manual intervention. Additionally, this model has the capability of handling a broad range of wafer diameters and thicknesses. In T 5723ES equipment, a Central Control Unit serves as the base station from which all testing operations are conducted. This unit contains a high-speed CPU that allows for the efficient management of test operations, ensuring that errors detected during the test process are handled in a timely manner. The system also features an advanced algorithm-based calibration unit, which helps to ensure accurate and precise measurements. This machine is also equipped with a graphical user interface (GUI) for easy operation and control. Additionally, ADVANTEST T 5723ES tool is equipped with an array of high-performance optical sensors that are capable of measuring a wide range of parameters. Some of these parameters include signal frequency, amplitude, and complex signal distortion. Furthermore, this asset is also able to measure die-plasticarcy, die-marketability, die-strength, and die-resistance. In addition to its testing capabilities, T 5723ES model also features a comprehensive range of safety measures and components, including temperature sensing devices, over-current protection, surge protection, and EMI protection. These features help to ensure that the test operations are conducted safely and securely, minimizing the chances of any damage to both the test equipment and the device being tested. Finally, ADVANTEST T 5723ES system boasts a comprehensive set of diagnostic tools, increasing the overall efficiency of the testing process. These tools include the ability to debug, trace, and skillfully navigate through the test results, helping engineers to quickly and accurately identify any errors or abnormalities in the testing process. Overall, T 5723ES is a feature-packed Final Test unit that provides reliable and precise testing results. This machine is well-suited for a wide range of semiconductor device testing, and utilizes sophisticated algorithms to guarantee accurate results. With its comprehensive safety measures, robust feature set, and ease of use, ADVANTEST T 5723ES is a superb choice for any Final Test tool.
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