Used ADVANTEST T 5771 ES #159780 for sale

Manufacturer
ADVANTEST
Model
T 5771 ES
ID: 159780
Vintage: 2004
Flash memory tester Capable of testing 128 devices simultaneously 2004 vintage.
ADVANTEST T 5771 ES is a highly advanced, cost effective final test equipment for the production of semiconductor components. The system combines high accuracy and fast speed in one robust and compact design. It features a high-speed, high-precision, advanced testing unit for the selection and verification of components, even under the harshest conditions. The main features of ADVANTEST T 5771ES include: high dynamic speed and precision, up to 400 Hz; a wide range of measurement machine designs; low power consumption; ultra-reliable performance at high temperatures; compact, rugged design; and full automation functionality. The tool also offers flexible test configurations and various data collection options, as well as multiple communication interfaces. The asset uses advanced technology to accurately and rapidly measure electrical parameters such as resistance, capacitance, inductance, power output, and frequency. It uses an automated model that can measure, sort, and separate components under harsh conditions and environments. The equipment also offers advanced test programs, with the ability to quickly run multiple tests in a fast, accurate and repeatable manner. T 5771 ES is one of the most advanced and cost effective solutions available for electronics and semiconductor testing. The system is built to handle a wide range of components, deliver accurate results in a reliable manner, and perform testing quickly and with high precision. It can deliver highly accurate results to customers for the exact requirements of the application. The unit also includes advanced diagnostic capabilities, allowing the user to quickly identify problems and resolve them quickly. Additionally, the machine can be easily integrated into existing production lines or new production lines due to its cost effectiveness and reliability. T 5771ES is an ideal solution for the automation of semiconductor testing as it offers reliable performance, high-precision test results, flexibility, full automation capability, and a wide range of measurement options.
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