Used ADVANTEST T 5781ES #9081300 for sale

ADVANTEST T 5781ES is a final test equipment designed to provide various test types to support highly dense, low-cost digitized products. With an integrated platform supporting a range of test methods, including logic tests, timing tests, and parametric tests, the system is designed to streamline the testing process and get products to market faster with improved outcomes. ADVANTEST T5781ES offers a high-speed logic test with cycle times ranging from 900 to 3,600MHz. It combines a low-quantity unit (LQS) structure with an in-line layout structure, creating a test machine that is equipped with multiple tools for performing high-bandwidth tests quickly and accurately. The LQS structure utilizes a small number of multi-processor cores that contain both logic and timing test programs. This ensures that tests are quick and allow for the use of smaller test spaces, reducing test cost. The integrated timing test operates on a tool clock capable of speeds of up to 4GHz and more. This allows for the transmission of signals at a much faster rate, improving both the speed and accuracy of the test results. The timing test is designed to analyze asset performance and analyze the timing between multiple signals quickly. T 5781ES also comes equipped with parametric tests, allowing for improved performance as well as a full analysis of parameters within a specified frequency range. These tests are often used to determine if a device has a specified gain, noise figure, conversion ratio, and other parameters. Parametric tests are especially useful for testing a variety of RF devices in a single model. T5781ES is designed to support a range of device technologies, including advanced SiP, WLCSP, and MEMS. In addition, it provides 5-nanometer resolution support for a wide variety of device applications. This high-resolution testing supports complex, low-overhead product designs, allowing for improved testing accuracy and higher yields. Overall, ADVANTEST T 5781ES is a powerful final test equipment that supports a variety of test types and supports new device technologies. With its integrated, high-speed logic and timing tests, as well as parametric tests, it is designed to provide an efficient and cost-effective way to test highly complex products. This system is an excellent choice for any manufacturer looking to reduce test costs and get their products to market faster.