Used ADVANTEST T 6331 #163127 for sale

ADVANTEST T 6331 is a final test equipment designed for reliable and repeatable production testing of small- to medium-sized electronic devices. The platform enables device characterization and optimization in electronics production environments and is capable of testing a broad range of devices, such as processors, memory, radio frequency, and digital devices. T 6331 employs an integrated modular design, which enables the configuration and expansion of the system and its subsystems, so that it can meet the requirements of the individual application. This design also allows for fast setup, configuration and maintenance. The unit uses a Windows-based GUI for operation. It is capable of testing up to 8 devices simultaneously at up to 8 GHz / 8Bin rates. It supports a wide range of test and measurement devices, including Power Supplies, Network Analyzers, Spectrum Analyzers, Multi-Channel Analyzers and Digital Oscilloscopes. ADVANTEST T 6331 also features an open architecture that allows for easy integration of custom test programs and third-party software. T 6331 comes with a Fully-featured Monitor Suite that allows the machine to measure device parameters. This includes the ability to measure temperature, frequency, timing, load and range. Additionally, this suite includes tools for device configuration, tool optimization and fault location. ADVANTEST T 6331 features a robust asset security model that ensures data integrity and privacy, as well as comprehensive equipment diagnostics. It has comprehensive error and fault reporting, as well as detailed system information logs that can help identify potential problems and enable quick resolution. The unit is designed for efficient operation in even the harshest production environments and is constructed with a combination of solid hardware components, flexible software and robust hardware-software integration. It offers superior performance, reliability, scalability and maintainability, to ensure the highest possible test throughput and reproducibility from the test bench.