Used ADVANTEST T 6361 #158516 for sale

ADVANTEST T 6361 is a final test equipment developed by ADVANTEST Corporation, a leading semiconductor test solutions provider. The system provides a full suite of test coverage, ranging from single device testing to entire unit testing solutions. It is used to effectively test semiconductor products, from general purpose ICs to advanced process nodes and multicore SoCs. The machine supports a wide variety of test programs, such as Vectorless, Tool-on-Chip (SoC) diagnosis and characterization, Guardband Analysis, Flash Programming, microwave device testing, and a variety of measurements, such as surface mount, thru-hole, radio frequency, time-domain, and power / logic measurements. This makes it suitable for high-volume production environments. T 6361 also provides exceptional speed, accuracy and flexibility for test solutions, combining digital instruments, sampling oscilloscopes, digital multimeters, noise analysis instruments and pulse instruments. In addition, the asset offers users access to various software tools, such as digital signal analysis, parameter extraction and failure analysis. The software tools are equipped to verify that specific digital components and integrated circuits (ICs) perform adequately and meet design and quality criteria. ADVANTEST T 6361 model is also equipped with a scalable hardware platform to support growing test requirements and a range of high-speed solutions, including pattern generators and digital/analog test points. By automating test setup and configuration parameters, the equipment eliminates the need for tedious manual measurements and reduces the down time for testing. Moreover, the system's on-site diagnostic and maintenance capability allows it to be used in an offline environment without the need for external resources. Overall, T 6361 Final Test Unit is a reliable and efficient solution for high-volume production testing of semiconductor products. It is highly-flexible and provides exceptional speed and accuracy. Additionally, the machine includes several software tools to analyze critical parameters and identify potential defects. With its range of features, it is suitable for testing a wide variety of semiconductor parts, from general purpose ICs to advanced process nodes and multicore SoCs.