Used ADVANTEST T 6361 #163197 for sale

Name: ADVANTEST T 6361
Brand: ADVANTEST
SKU: 163197
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 6361

ID: 163197

Lot of Boards: BGS-026485 RVS BGS-026784 CONTACT BMS-026487 LCDPE, 8MW BGS-026785 LCDPE DUMMY BGS-026783 TERM BMS-026480 EVENT BMS-025853 PE, 16MW BIR-026230 OPPG, 4GW BIR-026230X02 OPPG, 16GW BGR-026350 PG DUMMY BIR-026229 SQPG BIS-025826X11 THIF (STICK),T6371 BIS-025826X12 THIF (STICK),T6361 BIS-025826X13 THIF (STICK),T6331 BGR-026706 40VPPS BGR-026707 20VPPS BGR-026245 IFL BGR-026705 HVDC CONT BGR-026701X03 HVDC BGR-023713X02 UDC BGR-023712 UDC CONT BGR-02640 BUS IF BGR-023711X02 MDC BGK-025646 TC4 TBUS I/F WBL-H36770ATC4 TC4 BGK-026740 ND1 SYS-MON H3-6815 GPIB-VME BGK-023083 Extension I/F, Mixed BGK-025648 TC4 BUS I/F WBL-H36770AENG ENGINE-50 BGR-026479 AQM WBL-H36824MIF I/F WUN-2R5V5B WUN-3V5B WUN-2R5V5VDM5V2B.

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ADVANTEST T 6361 is a comprehensive final test equipment designed to meet the needs of semiconductor manufacturers across a wide range of test applications. It is an advanced platform for functional testing, wafer sort testing, and device characterization, enabling both high-performance and cost-effective testing. The system is highly configurable, and can be customized for each specific application. T 6361 unit offers a wide range of features to ensure reliable testing and results. It is equipped with the latest in testing technology such as an automated prober for contact-type tests, high-speed measurement systems, radiation measuring systems, and AC signal simulation. It also features fast wafer probing and data collection, providing highly accurate test results. Additionally, the machine is designed with a robust thermal management tool and low-power operation to optimize power consumption and reduce operational costs. To ensure test efficiency, ADVANTEST T 6361 has a large capacity FIFO buffer and multi-DUT software. The FIFO buffer allows for the storage of multiple test operations before they are processed, reducing processing time and improving throughput. The multi-DUT software allows multiple device tests to be processed at the same time, further increasing test efficiency. In addition, the asset has an integrated visual inspection station that can be used to visually inspect devices and determine their functionality. T 6361 also offers a wide range of analysis functions, enabling flexible and user-friendly test programming. It includes functions for measuring device characteristics like transistor currents, voltage thresholds, and time delays. It also offers a full range of fault analyses such as IDDQ, ESD, and EMVF. Additionally, the model can be used for measuring device noise, power consumption, and temperature performance. Overall, ADVANTEST T 6361 is a robust equipment that provides accurate and reliable results for testing and characterization of a wide range of semiconductor devices. Its comprehensive features make it an ideal tool for a variety of test applications.