Used ADVANTEST T 6372 ND2 #293615283 for sale

ADVANTEST T 6372 ND2 is a general-purpose, bench-type final test equipment designed for high-speed inspection of semiconductor ICs and discrete components. The system offers a wide range of test and analysis capabilities, including production testing, product characterizations and measurements, failure analysis, and research and development work. The unit can be equipped with a variety of specialized probes and standard voltage or current sources, as well as specialized RF devices, for automated testing and analysis of integrated circuits, microprocessors, memory devices, and other electronic components. The machine features a high-speed controller for quick I/O access to test subjects, allowing for rapid testing times, thereby increasing testing throughput and efficiency. The tool also features precision sampling and processing for accurate results, with speed and accuracy options for highly accurate measurements, as well as multiple DUT and UUT support for analyzing complex, multi-part devices. Additionally, the asset supports digital and analog tests with a variety of output modes, including discrete digital, DC continuous, frequency domain and pulse-modulated, with pulse analysis and tracking, logic oscilloscopy and logic analyzer functions available. T 6372 ND2 also includes a powerful programming language (Common Test Language) which allows users to create customized test configurations, as well as enable extended test coverage and model control. This includes external instrument control, remote test execution, and batch testing capabilities. The equipment is built to meet the most stringent environmental standards and is equipped with a temperature controlled chamber to ensure the reliability and accuracy of testing in the most extreme conditions. Additionally, ADVANTEST T 6372 ND2 includes both production software and a real-time debug suite for debugging, troubleshooting and performing fault isolation. T 6372 ND2 is a comprehensive, user-friendly test system designed for high-speed, precision testing of integrated circuits, discrete components and other electronic parts. Its features provide robust testing capabilities to meet production testing and characterization requirements, and provide the flexibility necessary for advanced failure analysis, research and development work. The unit is built to meet the most stringent environmental standards and offers efficient, reliable and accurate testing performance for any high-speed test application.