Used ADVANTEST T 6372 ND2 #293615287 for sale

ADVANTEST T 6372 ND2 is a final test equipment designed to provide extra efficiency and reliability on the way to market introduction and mass manufacturing in semiconductor product acceptance. It is an integrated system built to deliver an unlimited number of test methods and other product targets, with a single final test unit across a wide range of organic substrates. T 6372 ND2 adopts a multi-channel architecture, with a total of 6 channels, permitting up to 8 pads to be tested simultaneously. All channels are of a high-frequency type, setting the performance and flexibility level for the machine. The user interface is easy to use, with a clear yet sophisticated graphical user interface (GUI). This eliminates any need for special training and provides quick execution of test sequences. ADVANTEST T 6372 ND2 offers both high-speed scanning and clock-synchronized throughput to achieve a full testing solution in batches. The fast scanning function permits test results to be obtained in a very short time with improved performance and accuracy. The clock synchronized throughput capability further enhances the efficiency of the test tool allowing for multiple recipes to be tested simultaneously. The asset has an integrated software platform. It supports a wide range of drive types and a variety of standard protocols. The T 6372 uses the UNIC protocol providing standardization and seamless communication with the controller or the on-board processors. Additionally, T 6372 ND2 has the capability to measure the die temperature, achieving faster and more accurate test results. ADVANTEST T 6372 ND2 is also equipped with an advanced fault analyzer that helps in troubleshooting. It includes a graphical display of the detected defects and an automatic event trigger; this allows for a detailed analysis of the test results, eliminating false alarms and increasing the efficiency of the model. T 6372 ND2 is designed for highly efficient production testing of various types of ICs and substrates. Its high-speed scanning and clock-synchronized throughput enable efficient and accurate testing and high-quality production without compromising cost efficiency. The embedded software platform provides easy access and reliability for engineering, with the powerful fault analysis feature allowing for complete and reliable diagnosis of production failures. This makes it an ideal integrated equipment for efficient testing of organic and substrate materials.