Used ADVANTEST T 6372 #9360943 for sale

Manufacturer
ADVANTEST
Model
T 6372
ID: 9360943
LCD Tester Test station Digital pin: 128 Channels LCD Pin: 512 Channels RVS (24 V) Pin: 32 Channels Timing generator (6 TE / Pin: 32 TS) SQPG Data Fail Memory (DFM): 256 W x 2 Bits/Pins Device power supply: 400 mA x 8-Channels UNIVERSAL DC Parametric measurement unit (4-Channels) Multi DC parametric measuring unit (8 MDC / 128-Channels) (7) Tester Controller (TC7) with 2 GB memory (2) Hard Disk Drives (HDD): 73 GB (3) CD-RW Drive units (4) GP-IB I/F (2-Ports) Smoke sensor STN Control panel EMO Switch Lock ring assy LCD Monitor, 19" ND2 Hi-fix Diag PB Test head shipping cart Inter lock cable Calibration performance board GPIB I/F Cable Cable duct A CE Marked.
ADVANTEST T 6372 is a Final Test Equipment (FTM) designed to enable semiconductor manufacturers to perform wafer-level tests on individual chips with exceptional accuracy and high-speed throughput. ADVANTEST T6372 is a fully automated system, enabling users to test a wide range of circuits with greater efficiency. The unit provides maximum device testing speeds, shortening the cost of test time. It offers high levels of test resolution, while its powerful data processing capabilities provide reliability and accuracy. To maintain the accuracy of the machine, T 6372 incorporates an integrated high-speed data collection tool that quickly transmits test data to its central controller. This controller stores the test results and generates detailed reports for analysis of wafer quality. T6372 also supports multiple test formats, such as foreign test, cell test, DFT test, high-speed test, fast test, and also supports process monitoring, statistical process control applications (SPC), and TTR logging. Its integrated test head can switch quickly from one wafer to the next, allowing for continuous chip testing. The asset's advanced design also enables parallel testing of different types of circuits simultaneously. It allows for customizable testing levels across a range of technologies, enabling users to configure the model exactly to their requirements. Antenna testing capabilities are also available, allowing for both 2D and 3D imaging of the test chips, while its data trace abilities provide detailed failure analysis. The equipment also allows for real-time cell testing, speeding up the time-to-market of new products. ADVANTEST T 6372 also incorporates comprehensive safety features, which protects the user and test system from electrical or mechanical faults. Its advanced temperature control unit allows for tests to be conducted at safely controlled temperatures, while the machine's software architecture is engineered to reduce time-to-market by automatically delivering detailed test results. The tool is backed by a well-trained service team for providing technical support for all users. The combination of this all makes ADVANTEST T6372 a reliable solution for complete wafer level chip testing.
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