Used ADVANTEST T 6373 #293812089 for sale

ADVANTEST T 6373 is a final test system designed for device development and production. Developed by ADVANTEST, a leading manufacturer of automated test systems and solutions, it supports a variety of semiconductor memory tests including DRAM, SRAM, flash, NOR, NAND etc., as well as logic ICs and discrete devices. ADVANTEST T6373 features a parallel tester platform with a 1152-pin P1K tester and modular cabinetry. It is capable of testing 1,440 devices simultaneously on 1,152 pins with its maximum pin count of 10,800 pins, and test channels of up to 8,117 pins. With its advanced EOL test function, T 6373 is able to detect dislocations on silicon wafers before fabrication process, resulting in improved yields. T6373's scanning options include dynamic scanning, advanced built-in non-scanning, the EOL scanning, and the fully programmable Test Source Trace software. Additionally, ADVANTEST T 6373 also offers high-speed and high-precision data processing, and a debug mode for pattern optimization and device characterization. ADVANTEST T6373 offeres a variety of accessories including multiple loadboards and unloaders, fixture interface plates, and Step and Repeat, Key Device Test (KDT), Windowing and Advanced Window Repair software modules. Analyzer and data storage options are also available, and a variety of environmental sensors can be used for environmental testing and monitoring. In addition to its testing capabilities, T 6373 also offers a wide array of productivity features. Its high-speed and high-precision die active area recognition capabilities allow for improved device test throughput. It also features a super-fast heat-sink operation, enabling a faster cycle time, and a Peak Speed option that helps boost test speeds up to ten times faster than traditional test systems. T6373's user-friendly and intuitive software platform provides an easy-to-use touchscreen interface with an array of virtual keys. It also supports series of software libraries, utilities, and optional modules that allow for quick and flexible programming. Furthermore, ADVANTEST T 6373 is compliant with the latest standards such as In-circuit debugging (ICD), Joint Test Action Group (JTAG), ICT4 standard, and IEEE 1149.1 (JTAG for Component Testing) standards. Overall, ADVANTEST T6373 offers an all-in-one solution for device development and production. Its robust testing capabilities, together with its wide range of productivity features and environmental monitoring solutions make it the perfect choice for delivering reliable, accurate, and high-speed testing.