Used ADVANTEST T 6573 #9149624 for sale

ADVANTEST T 6573 is a high-performance test equipment that has been designed for the reliable testing of integrated circuit (IC) devices. This system features a modular structure, enabling the user to customize the unit setup for the desired Test Machine Configuration to best suit the IC test requirements. The tool is composed of a control unit and an expansion unit for up to 12 independent test sites. This asset has enough flexibility to expertly test ICs with varying specifications. The model is fully programmable, allowing the user to create their own programs tailored for the specific ICs. This includes programming for pin assignment, Digital/Analog signals, Memory image, and result analysis. The equipment also allows the user to set up Transfer Function Measurement (TFM)- specific measurement algorithms and to program up to 10 TFM boards in parallel. T 6573 boasts state-of-the-art accuracy and sensitivity, allowing for operation at frequencies up to 500MHz, with a glitch detection sensitivity up to 5% duty cycle. This system also features a multi-channel synchronization capability for setting up tight latency levels across multiple channels. ADVANTEST T 6573 has been developed with a focus on robust reliability. It offers excellent overall reliability with many features designed to optimize performance, such as a continuous power cycle detection and active power-fail monitoring. In addition, the unit has a built-in self-checker and external monitoring to ensure machine health. The user interface of T 6573 is designed to be intuitive and easy to use with an integrated design for both software and hardware user control. The hardware front-panel interface provides ample navigation and quick operation controls. The software user interface is the ideal hub for managing the test tool, and features a customizing tool to set up different working modes of the test asset. Overall, ADVANTEST T 6573 is an ideal final test model designed to maximize accuracy and productivity for testing ICs of varying specifications. Its robust reliability ensures exceptional performance for the long-term testing of ICs; its customizable design provides flexibility and savings; and its user interface is easy to use for optimum operation.