Used ADVANTEST T 6575 #293651795 for sale

ADVANTEST T 6575 Final Test Equipment is a high-throughput, high speed, cost-effective test solution for integrated circuit (IC) production. This system is ideal for semiconductor companies that need to ensure quality and quickly identify and analyze defects before they reach their target market. ADVANTEST T6575 supports both the production of finished components and yield improvement functions to greatly increase productivity. T 6575 is a single station test unit which allows the efficient testing of multiple devices, including logic, analog, rf, and mixed-signal chips. T6575 is capable of testing up to 384 very large scale integration (VLSI) devices at once, with a 400MHz tester clock frequency. The machine is equipped with a 40-pin tester interface and a variety of tester software, aiding automated tests and debugging. It also allows for customized tests to be created and stored for specific projects. The tool offers a variety of test methods, including direct testing Or build a data conversion asset, allowing the user to measure and adjust the voltages and frequencies as desired. Additionally, multi-pattern/multi-scanning (M/M) technology enables ADVANTEST T 6575 to maintain a high test speed even when testing complex sets of circuits. With ADVANTEST T6575, you can also effectively analyze model-level issues through IC-level insight, allowing for rapid problem resolution and improved quality assurance. Other key features of T 6575 Final Test Equipment include an integrated on-wafer prober, a pneumatic prober, and an active contact automator, which provide a seamless and efficient testing process. The system also provides comprehensive parametric and functional test coverage, complete with digital I/O capabilities. Additionally, an embedded Linux operating environment allows users to design and store customized tests, as well as monitor tester performance through a suite of dedicated tools. In conclusion, T6575 Final Test Unit is an advanced and cost-effective solution for integrated circulation testing. Its scalability, flexibility, and reliability make it an ideal choice for semiconductor companies looking to quickly identify and analyze defects in order to produce high-quality products.