Used ADVANTEST T 6577 #293766496 for sale

ADVANTEST T 6577 is a Final Test system offering complete test solution for application-specific testing of a wide range of devices. It utilizes an innovative modular design to enable different functions and configurations to be specified based on the device being tested. The architecture is composed of two main modules: the TesterStation and the BaseStation. The TesterStation provides user access via an intuitive OS X interface that features an integrated application-specific test development environment. The BaseStation provides a low-cost hardware platform with scalable hardware configuration capabilities. It features a high speed tester bus and advanced control functions which allow for real-time control of test environment parameters. This includes support for simultaneous testing of multiple devices, reducing cost and cycle time to meet market requirements. ADVANTEST T6577 utilizes a distributed architecture in which the Core Station is located on the production floor and the Remote Panels, or RPs, are located remotely from each other, allowing for easier testing of complex network topologies. RPs can also be assigned different duties for different test projects, reducing overall cost and increasing test flexibility. T 6577 is also equipped with an array of advanced features, such as test applications, methods, and libraries which makes it easy to develop and troubleshoot device tests. It is also capable of controlling multiple devices simultaneously, and has built-in fail-safe capabilities to ensure high levels of test quality and accuracy. In terms of connectivity, T6577 is compatible with Ethernet, USB, serial and parallel interfaces. It also supports IEEE488, GPIB and SCSI protocols, allowing for communication with a variety of lab instruments for test automation. Overall, ADVANTEST T 6577 is a powerful and flexible Final Test system, offering a comprehensive testing solution for a wide range of devices. It combines a high speed tester bus with a modular architecture and advanced connectivity options, resulting in reduced cost and cycle time, enhanced test flexibility, increased accuracy, and smoother test development.