Used ADVANTEST T 6577 #9203054 for sale

ADVANTEST T 6577 is a versatile and comprehensive final test equipment for a wide range of applications. It is designed to provide comprehensive test and debugging capabilities for both digital and mixed-signal test systems. The system is equipped with a range of instruments and tools for testing and analysis, and can accommodate up to 48 instrument channels. It supports a range of programming languages, such as C, C++, and JTAG, which allows for easy access to control code. ADVANTEST T6577 is capable of testing devices of various pin count and types, from individual logic and memory components to complex mixed-signal devices. It has on-board driver controls and analog and digital I/Os for testing, as well as hardware pattern generators and a variety of built-in digital and analog instruments. It also features high-speed Scan Chain, JTAG and Unit-On-Chip (SoC) testing, HDL simulation, and HDL debugging. T 6577 is designed to reduce test times and improve test yields by minimizing the number of test set-ups and routines. It utilizes unique Auto-Setup and Auto-Pass/Fail features for quick and accurate results. The Auto-Setup function uses a dedicated library of premade tests, so that device bring-up to production ready is significantly reduced. Auto-Pass/Fail capabilities generate real-time results that can be tailored to each component. The machine also features mechanisms for reducing test resource overhead. The Resource Management feature tracks and schedules tasks to maximize test time efficiency. This allows components to be tested in order to identify and address any potential problems quickly. The tool can also create customized reports for test data and issue alerts whenever issues arise. T6577 has a small footprint, and provides a range of communication protocols for easy and cost-effective data management. The asset also features an on-board data logging model, and a download port for remote access of test data. This allows remote teams to access test data from anywhere and accelerate their test and debug processes.