Used ADVANTEST T 6671E #9179759 for sale

ADVANTEST T 6671E is a high-end, advanced automated test equipment (ATE) designed for use in a wide range of semiconductor assembly and final test applications. Designed with flexibility and reliability in mind, T 6671E utilizes advanced technology to provide an efficient, accurate, and easy-to-use testing platform. ADVANTEST T 6671E's multi-channel architecture combines eight independent groups with 4K bit (8K in expanded) memory per group, providing a total of 32K bit sites. It also features a multi-function test front end with channel control and sequencing, multiple logic comparison functions, timing and pulse parametrics, chip-level self-test, and analysis capabilities. As an advanced ATE, T 6671E also offers a built-in processor-based platform with an embedded user interface (UI), mixing highly complex software algorithms with a set of hardware components. The UI features a fully functional, easy-to-use graphical user interface (GUI) for test planning, sequencing, and programming. It also provides comprehensive data tests and measurement capabilities for test and debug of assemblies. For high-level test applications, ADVANTEST T 6671E provides extended test capabilities through its JTAG extensions. This allows for direct access of on-board memory, register bits, and peripheral IO, as well as support for external TDO and TMI accesses. As for final test applications, T 6671E is equipped with a wide range of fault coverage capabilities. Its Self-test mode (STM) supports memory testing, bit-error rate testing, and embedded scan testing. Error Detection Experiments (EDC) support simultaneous test for 4 channels of both mixed (MST) and single-bit (SBT), as well as Multi Cube Distribution (MCD). Finally, ADVANTEST T 6671E offers enhanced flexibility and connectivity through GP-IB, Ethernet, and Serial interface support, allowing for integration with external systems. In short, T 6671E is a powerful and reliable ATE system designed for a range of application areas. Its robust, processor-based architecture, JTAG extensions, fault coverage capabilities, and wide range of connectivity options provide engineers and technicians with an advanced, easy-to-use platform for final test applications.