Used ADVANTEST T 6672 #293652881 for sale

ADVANTEST T 6672 Final Test Equipment is a cost-effective, high-throughput testing solution specifically designed to verify the functionality of complex semiconductor devices. The system can test at up to 320 mega tests per second, making it suitable for both high-volume and complex devices. The test unit is composed of three primary modules: the automated test head (ATH), the programmable logic controller (PLC), and the test interface (TI). The ATH contains a device interface for connecting to the device-under-test (DUT), as well as various testhead control, measurement SMUs, power supplies, and jig drivers. The PLC is responsible for controlling the test setup and operation, with programming available in both C and IEC 61131-3. It also provides powerful step-by-step debugging capabilities during development, enabling the user to rapidly troubleshoot any issues that arise. Finally, the TI provides a common interface for other test equipment, such as pattern generators, SCUs, and oscilloscopes. The test machine offers several features that enable it to effectively handle even the most demanding of applications. These include on-the-fly adjustments, such as altering test regimes mid-test; rapid test set-up and reconfiguration, enabled by the graphical program development and quick-access DUT connection ports; output transient control to ensure high test reliability; and precision tolerance checking for measuring critical parameter values. In addition, ADVANTEST offers several options for further enhancing T 6672. These include automotive-grade testing for use in automotive-grade systems; embedded diagnostics for debug and analysis; and comprehensive software packages for a variety of test applications. Overall, ADVANTEST T 6672 Final Test Tool is a highly powerful, versatile and cost-effective solution for verifying the functionality of complex semiconductor devices. Its fast test speeds, multi-configurability options, and optional software packages make it an ideal choice for testing in high-volume production environments.