Used THERMA-WAVE TP 420 #9096588 for sale

TheTHERMA-WAVE THERMA-WAVE TP 420 wafer testing and metrology equipment is a powerful metrology tool for inspecting wafer patterns and thin films for process control and clean processing of semiconductors. The system offers several features and advantages to meet the most demanding metrology requirements. TP 420 unit has a comprehensive range of measurement capabilities, including optical surface metrology, high-throughput electrical measurements, and optical defect inspection. It is designed to clearly visualize, chart, and record surface features and defects for precise inspection. The machine has high-precision optics, sophisticated signal processing, advanced algorithms, and data integration for quick overviews and detailed analysis of wafer pattern and thin film inspection. THERMA-WAVE TP 420 is capable of rapidly collecting sub-pixel level height measurements using the DualFocus™ platform. This platform enables both high-accuracy and high-resolution measurements to be taken quickly; it also minimizes vibration and increases the overall accuracy of results. The tool also provides a variety of automated inspection methods to detect both light and heavy defects. TP 420 asset is built with an intuitive user interface that can be used to quickly access all of the model's features and capabilities. Advanced automation software allows users to easily specify requirements, review and modify result sets, and share data with others in real-time. This provides full integration of metrology tools and platforms for improved quality assurance. In addition, THERMA-WAVE TP 420 equipment offers comprehensive reporting capabilities. It can generate comprehensive reports based on a variety of processing parameters and fault conditions. This ensures that all defects and their causes are accurately tracked, resulting in higher yield and process control. Overall, theTherma-Wave TP 420 wafer testing and metrology system is an efficient and versatile solution for process control. It offers comprehensive measurement capabilities, intuitive user interfaces, advanced automation, and comprehensive reporting capabilities for improved performance and greater reliability.