Used FEI FIB 200 #9120060 for sale

FEI FIB 200 is an advanced scanning electron microscope (SEM) designed for a range of detailed surface imaging and analysis applications. This advanced imaging system marries focused ion beam (FIB) technology with SEM imaging to offer superior performance and capabilities. It is ideal for microscopy and micro-fabrication work related to nanoscale components and technologies. FIB 200 features a charged beam chamber which simultaneously accommodates an electron gun and a focused ion gun. The electron beam is used for imaging and analysis and the focused ion beam (FIB) is used to perform micro-machining and grain removal from a sample surface. This allows for exceptional resolution and imaging of extremely small detail. The microscope operates with a voltage range of 0-30 kV and beam currents of 0-1000 pA. The microscope has a rotational sample stage which gives 360 degree access to a sample surface and can be automatically indexed to multiple angles. By indexing a sample, large-area imaging and analysis can be acquired across a relatively large area. To improve the resulting images and analysis, several automation features are included, including automated tilt and autofocus. In addition, several software packages can be installed to aid in image acquisition, data processing and networking with other systems. In addition to imaging and analysis, this advanced tool also allows for direct-write nanolithography. This is a very powerful feature which can be used for thin film deposition, patterning, site-specific fabrication, micromachining, and other nanoscale modification. Overall, FEI FIB 200 is an advanced, highly automated scanning electron microscope designed for a wide range of imaging and analysis applications. The combination of electron and focused ion beam technology, powerful automation, and nanolithography capabilities make this tool the perfect instrument for materials analysis and nanoscale manipulation.