used KLA / TENCOR / PROMETRIX (KT) for sale
53 RESULTS FOUND FOR: used KLA / TENCOR / PROMETRIX
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Wafer inspection system 2006 vintage. -
Non-pattern surface inspection system, 4"-8" PSL Calibration Defect sensitivity: 0.1 Micron (PSL STD... -
Unpatterned surface inspection system, 6"-8" Bare silicon wafers With films surface particles & defe... -
Patterned wafer inspection system Repeatability: < 3% Mean count: 500 Particles Diameter latex spher... -
Particle inspection station, 8" Patterned surface inspection system ARGON Laser Power supply: 208 V,... -
Patterned wafer inspection system, 6"-8" Double darkfield inspection tool SECS II/GEM Communication ... -
Stylus profiler. -
Overlay measurement system 2011 vintage. -
Wafer handler. -
Film thickness probe system. -
Film thickness probe system. -
Film thickness probe system Power supply: 5000 VAC, 1 Phase. -
Review station, 12" 2006 vintage. -
Metal film thickness meter system, 6" 1987 vintage.
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Resistivity mapping system, 6"-8" 1993 vintage.
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Resistivity mapping system, 6"-8". -
Mapping system.
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Resistivity mapping system. -
Resistivity mapping system, 2"-8" Cassette autoloader Wafer measures: up to 1264 Sites Resistance: <... -
Resistivity mapping system.