Used CHROMA 7936 #293649887 for sale
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CHROMA 7936 is an advanced mask and wafer inspection equipment with superior imaging performance for patterned sample inspection. It uses bright field CCD technology to provide excellent top-down imaging and contrast, as well as highly sensitive 3D inspection capabilities, making it an ideal system for production defect inspection and failure analysis. 7936 utilizes a bright Field CCD camera and 5 watt Halogen illumination unit with variable intensity adjustments to provide supreme lighting contrast. This allows it to inspect both opaque and transparent samples with a high dynamic range of intensity and contrast, making it an effective machine for visual inspection of transparent as well as opaque samples. The tool utilizes an 18" LCD display allowing the user to view any defect or asset error. The LCD display has 1280 x 1024 resolution and an automatic brightness adjustment model which allows users to probe samples without worrying about extraneous lighting. CHROMA 7936 also has automatic focus capabilities which can adjust for samples of any depth, giving it a wider range of inspection capabilities than comparable systems. In addition, the equipment provides superior image resolution, up to 4 microns per pixel. This guarantees that even the smallest defects or errors can be discovered with precision. The system can also be upgraded with additional features like a 50X optics or optional incident lighting for better contrast and black/white separation. For more advanced inspection needs, 7936 also supports automated movable stage with AOI software, giving it the capability to inspect larger areas on a sample. In addition to the advanced capabilities, CHROMA 7936 is easy to operate. A simple, intuitive user interface allows users to quickly set up and select the desired diagnostics and inspection parameters. The unit also provides fully-automated defect recognition capabilities, eliminating the need to manually count defects. 7936 is an impressive and capable mask and wafer inspection machine that is well suited for production defect inspection and failure analysis. It provides superior imaging performance, adjustable illumination contrast, advanced focus control and resolution as small as 4 microns per pixel, making it an ideal tool for small and large sample inspection.
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