Used METRICON PC 2010 #9112668 for sale

METRICON PC 2010 is a mask and wafer inspection equipment designed for the manufacturing of semiconductor integrated circuit (IC) devices. This system provides an automated solution for inspecting the integrity of IC masks and wafers during the process of chip production. The unit is composed of a computer with a camera attached to a microscope. The microscope allows the user to magnify the wafers and masks by up to 5000x and the camera is used to take photographs of the IC structures. The machine also includes a suite of software which can be used to make automated measurements of the IC structures which ensures that the wafer and masks meet the industry standards. The tool can perform the following tasks: identify patterns on masks; detect defects in wafers; detect error patterns caused by misalignment; measure feature sizes; measure wafer form variation; measure overlay shift and registration; measure cross-sectional area; and measure line resistance. METRICON PC-2010 also comes with a comprehensive data acquisition asset which can collect data from multiple points on a single chip during the same inspection. This allows for a greater level of accuracy and precision when making observations about the manufacturing process. The model also provides statistical data analysis to provide a better understanding of the chip production process. PC 2010 equipment is designed to be highly reliable and easy to use. It is also able to calibrate itself for better accuracy and repeatability. The system offers automated control of the microscope allowing for faster and more accurate inspections of the IC chips. With its high accuracy, fast speed, and comprehensive data acquisition abilities, PC-2010 unit is an exceptionally useful tool for semiconductor device manufacturers as it can significantly reduce the time and cost associated with chip production while also ensuring that the products are of the highest quality.