Used METRICON PC 2010 for sale

Mask & Wafer Inspection

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METRICON

Model

PC 2010

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Prism coupler Wafer measurement: Refractive index Thickness: Thin films layer stack Dual film measur

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Prism coupler thin film measurement systems.

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Dual wavelength prism coupler Seiko SPU-414 Thermal printer 1998 vintage.

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Prism coupler Seiko DPU-414 thermal printer 1997 vintage.