Used METRICON PC 2010 #9245359 for sale

METRICON PC 2010 is a mask and wafer inspection equipment developed by METRICON, a German company. Designed to be used for high-precision inspection of reticles, wafers, or other flat masks, this system can detect fine defects such as contamination, pinholes, voids, stains, debris, and other imperfections. The unit is equipped with an advanced optical machine with high resolution and contrast to provide superior imaging performance. The LED light source used for the tool offers uniform and stable illumination with excellent accuracy. The built-in monitor presents an easy-to-use graphical interface, and multi-reflection detection ensures high efficiency and productivity. METRICON PC-2010 is compatible with a variety of software programs for data analysis. These programs can detect a variety of defect types including dirt & dust particles, scratches, contamination, pinholes, voids, stains, flakes, and irregularities in thickness or appearance. The asset can also check for misalignments in alignment marks. PC 2010 is also equipped with a variety of electrical, mechanical, and motion control features, making it suitable for high-speed and accurate scanning. The model is designed to reduce operator fatigue and improve efficiency. It also supports standard signaling logic for processing and evaluating results. The equipment can be expanded to include new features such as the ability to measure chromatic coordinate values, spot meter scanning, advanced pattern recognition, or special data outputs for use in robotics. Additionally, PC-2010 can be used with manual or automatic sorting systems. This system is well-suited for both scientific and industrial challenges. It can provide information on optical properties of masks, as well as deliver results on semiconductor device quality or particle contamination. It also offers the possibility of detailed image analysis and can be used as a basis for further unit designs.