Used METRICON PC 2010 #9244730 for sale

METRICON PC 2010 is an automated mask and wafer inspection equipment designed for inspecting high-resolution lithographic images. The system is capable of detecting anomalies and other defects in near real-time as the wafer is scanned. The PC version is the most popular in the series due to its low cost and its ability to quickly detect a wide variety of defects. The PC version of the unit uses metrics-based scanning software to capture images of the wafer at high speeds. These images are taken at 3 microns, allowing for the identification of even the smallest anomalies. The software also takes into account the environment it is placed in to help ensure accurate results. The machine is capable of detecting a variety of wafer defects, including scratches, pits, bumps, and foreign matter. It can also detect low voltage signals, allowing the tool to detect problems that could potentially cause chip failure. In addition to its high speed and accuracy, the asset features a low power consumption. This helps to reduce operational costs while ensuring the model can run continuously without interruption. The equipment is designed to be extremely reliable and is capable of a long-term performance. It also features an intuitive user interface, allowing even the most novice of users to quickly become accustomed to the system without taking up too much of their time. The unit has been designed to be compatible with a variety of other industry standard technologies and software packages, allowing for greater accessibility and easier integration. Overall, METRICON PC-2010 is an essential tool for the inspection of advanced lithographic images, providing fast and accurate results. With its low cost and high performance it has become the industry standard for mask and wafer inspection.