Used NANOMETRICS NanoSpec AFT 210 #293656608 for sale

NANOMETRICS NanoSpec AFT 210 from NANOMETRICS is a professional-level Mask & Wafer Inspection equipment designed for semiconductor fabrication. It offers mask and wafer imaging via highly advanced high-resolution scatterometry, as well as high-accuracy in-die metrology. The system features an integrated 20x magnification image well that performs automated wafer features inspection and a top down 3.5x image well that provides a larger field of view to see across the entire wafer. The inspection unit supports optical mask and wafer imaging, monitoring and evaluation of lithography patterns, mask and wafer stitching, as well as in-die metrology. NANOMETRICS NANOSPEC / AFT 210 comes with a fully automated wafer mapping capability, so that it can quickly acquire both optical and scatterometry data for the various aspects of a mask or wafer fabrication process, such as defect density and overlay measurements. The scatterometry imaging supports a wide range of wavelength ranges, enabling inspection of different processes and geometries. It can detect patterns with line widths as small as 0.018 microns. For precise in-die metrology measurements, the machine uses its onboard metrology sensor, which offers both high accuracy and high resolution. It can measure overlapping, multi-layer patterns to within a few nanometers. The tool can also detect and measure defects, stifling/tilting and other irregularities. In terms of usability, the asset has an easy-to-use touchscreen interface, so that users can quickly set up and operate the model. It also offers a variety of software tools for data analysis and manipulation. The equipment comes with an option to integrate additional metrology tools, such as a multiple thermal lithography and an advanced patterning metrology system. Overall, NanoSpec AFT 210 from NANOMETRICS is an excellent option for semiconductor fabrication that is sure to meet all your inspection and metrology needs. With its high resolution imaging and automated wafer and mask mapping, you can ensure accuracy and quality throughout your production flows.